A method for evaluating the overall roughness of three-dimensional irregular particle surface

Abstract

The invention provides a method for evaluating the overall surface roughness of three-dimensional irregular particles, comprising the following steps: S1, using a three-dimensional scanner to scan the three-dimensional irregular particles, and obtaining point cloud data on the surface of the particles; S2, using the scanning obtained The coordinates of the particle surface point, the spherical harmonic function with the highest height n=25 is used to reconstruct the three-dimensional geometry of the particle surface, and the reconstructed virtual particle is used as the reference smooth particle, and the overall roughness of the particle is evaluated based on the difference between the real particle and the reference particle S3. Using the reconstructed virtual particle as a reference smooth particle, evaluate the roughness of the real particle based on the volume enclosed between the actual particle surface and the reference particle surface and the reference particle surface area. The beneficial effects of the invention are: the overall roughness of the entire particle can be evaluated; the influence of the overall geometry of the three-dimensional irregular particles can be considered.

Description

technical field [0001] The invention relates to the evaluation of surface roughness, in particular to a method for evaluating the overall surface roughness of three-dimensional irregular particles. Background technique [0002] Surface roughness refers to the unevenness of small pitches and tiny peaks and valleys on the surface of an object. The distance (wave distance) between the two peaks or two troughs is very small (below 1mm). The smaller the surface roughness, the smoother the surface. [0003] In order to study the influence of surface roughness on the performance of parts and the need to measure the microscopic unevenness of the surface, from the late 1920s to the 1930s, some experts in Germany, the United States and the United Kingdom designed and produced optical microscopes such as optical section microscopes and interference microscopes. The instrument used to measure the microscopic roughness of the surface by using this method creates the conditions for quan...

AI Technical Summary

Problems solved by technology

[0014] (1) For three-dimensional irregular particles, current methods such as the stylus method and interferometry can only measure the local roughness of the particle surface, but cannot evaluate the overall roughness of the entire particle;

[0015] (2) The current roughness evaluation methods and indicators can only consider the influence of local geometric features, but cannot consider the influence of the overall geometry of three-dimensional irregular particles

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