Fixing device for bendable sample based on terahertz spectrometer, measuring system and measuring method
A fixed device and spectrometer technology, which is applied in the field of terahertz applications, can solve the problems of difficult to realize flexible sample testing and impossible sample testing, and achieve the effect of increasing the measurable range
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[0036]The fixing device, measurement system and measurement method of the flexible sample based on the terahertz spectrometer according to the present invention will be further described according to the specific embodiments of the present invention and the accompanying drawings, but this description does not constitute an inappropriate interpretation of the present invention. limited.
[0037] figure 1 It is a structural schematic diagram of an implementation mode of a flexible sample measurement system based on a terahertz spectrometer according to the present invention.
[0038] like figure 1 As shown, in this embodiment, a measurement system 1 for a bendable sample based on a terahertz spectrometer includes a terahertz time-domain spectrometer and a fixing device. Among them, the terahertz time-domain spectrometer can adopt the TERA K15 of MenloSystems, which can include a femtosecond laser 31, a transmitting antenna 32, a first terahertz lens 33, a second terahertz lens...
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