Method for determining accelerated test time of high temperature life of aircraft anti-skid brake control device

Abstract

The invention relates to a method for determining the accelerated test time of high temperature life of an aircraft anti-skid brake control device. An accelerated test model of the high temperature life of the aircraft anti-skid brake control device is established by using a linear cumulative damage theory, and an accelerated test scheme is established according to the accelerated test model of the high temperature life. Through the accelerated test of the high temperature life, hidden trouble of high temperature fault of the aircraft anti-skid brake control device in a first turning period isexcited in a short test period, so as to eliminate the high temperature fault in the first turning period. The method is widely used in high temperature life tests, and can effectively excite high temperature fault and save resources.

Description

technical field [0001] The invention relates to the field of testing of civil aircraft anti-skid brake control devices, in particular to a method for determining the duration of high-temperature life acceleration tests. Background technique [0002] The high-temperature life test of electronic products is to formulate a high-temperature life test plan for electronic products and complete the test according to the high-temperature working time during the first turnaround period of the aircraft, so as to ensure that the electronic products will not cause failures caused by high temperatures during the first turnaround period. [0003] The high temperature life accelerated test is: in the high temperature life test program, the temperature value is increased, and the mathematical model is used to calculate and shorten the test time of the high temperature life, and the purpose of reducing energy consumption is achieved by reducing the test time. [0004] After investigation, th...

AI Technical Summary

Problems solved by technology

[0019] 1) MIL-STD-2164 ignores the cumulative damage caused by high temperature to electronic products during the first overturn period, and does not have the function of verifying high temperature life;

[0020] 2) The high-temperature test time in GMW8287 is not determined according to the life requirements, and does not have the function of determining the high-temperature life index based on the test data; this standard does not verify the high-temperature life of electronic products

[0021] 3) None of the domestic invention patents mentioned the problem of determining the high-temperature life of the anti-skid aircraft anti-skid brake control device

[0022] In summary, electronic products at home and abroad have not carried out high-temperature life accelerated tests of electronic products, and there is no mathematical model for calculating the time of high-temperature life accelerated tests

[0023] 4) American scholar Stave Smithson used 400,000 triodes to conduct experiments at different temperatures, although it proved that the logarithmic coordinate system is a straight line, which conforms to the principle of linear cumulative damage, but he did not continue to use the linear cumulative damage theory to study and test the high-temperature life. Lack of methodological content for assessing high temperature lifetime