High current injection probe and electromagnetic compatibility test device

A technology of current injection and testing equipment, which is applied in the direction of testing electrical equipment, measuring equipment, and components of electrical measuring instruments during transportation, and can solve problems such as insufficient rigor

Pending Publication Date: 2019-01-01
GUANGZHOU CHANGEN ELECTRONICS TECH CO LTD
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0004] The embodiment of the present invention provides a high-current injection probe and an electromagnetic compatibility testing device to solve the technical problem of insufficient tightness when the existing high-current injection probe is closed, thereby improving the tightness when the high-current injection probe is closed, and then Improving the Accuracy of Electromagnetic Compatibility Test

Method used

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  • High current injection probe and electromagnetic compatibility test device
  • High current injection probe and electromagnetic compatibility test device
  • High current injection probe and electromagnetic compatibility test device

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Embodiment Construction

[0030] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

[0031] See figure 1 The embodiment of the present invention provides a large current injection probe 2, including a body, the body includes a first current injection clamp 21 and a second current injection clamp 22, one end of the first current injection clamp 21 and the first current injection clamp 21 One end of the two current injection clamps 22 is connected by a hinge, the other end of the first current injection clamp 21 is provided...

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Abstract

The invention discloses a high current injection probe comprising a body. The body comprises a first current injection clamp and a second current injection clamp. One end of the first current injection clamp is connected with one end of the second current injection clamp through a hinge. A magnetic connector is arranged on the other end of the first current injection clamp. The other end of the first current injection clamp is magnetically adsorbed on the other end of the second current injection clamp through the magnetic connector. The closing tightness of the high current injection probe can be effectively enhanced so as to enhance the accuracy of the electromagnetic compatibility test. The invention also provides an electromagnetic compatibility test device.

Description

Technical field [0001] The invention relates to the technical field of electromagnetic compatibility equipment, in particular to a large current injection probe and an electromagnetic compatibility testing device. Background technique [0002] At present, products such as automotive electronics need to undergo electromagnetic compatibility tests, including electromagnetic susceptibility testing, to verify whether automotive electronic products can work normally under electromagnetic interference. [0003] In the prior art, the high current injection method test is a common test item in the electromagnetic compatibility test of auto parts products. The purpose of the test is to test the anti-interference ability of the product against the interference signal coupled to the wiring harness. The high current injection probe clamp sleeve is usually used. On the wiring harness of the product under test. The existing large current injection probe is composed of two semicircular magnetic ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R1/28
CPCG01R1/28G01R31/001G01R31/006
Inventor 李楠李军
Owner GUANGZHOU CHANGEN ELECTRONICS TECH CO LTD
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