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Integrated circuit testing excitation generation system based on modular excitation model

An integrated circuit and test stimulus technology, which is applied in the field of integrated circuit test stimulus generation system, can solve the problems of complex debugging and high labor costs, and achieve a systematic effect

Inactive Publication Date: 2018-12-21
北京京航计算通讯研究所
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] The technical problem to be solved by the present invention is: how to solve the contradictions of the current integrated circuit testing technology, high labor cost, and complicated debugging, and improve the system, timing, visualization, and test case batch processing functions of the integrated circuit simulation test environment

Method used

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  • Integrated circuit testing excitation generation system based on modular excitation model
  • Integrated circuit testing excitation generation system based on modular excitation model
  • Integrated circuit testing excitation generation system based on modular excitation model

Examples

Experimental program
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Embodiment 1

[0059] In this example,

[0060] 1) This method is applied to a simulation support platform for integrated circuits. In the simulation platform, the integrated circuit and its peripheral system architecture are analyzed, and the tested integrated circuit and its peripheral interface modules are determined.

[0061] 2) Analyze the test case, determine the input and output objects of the relevant data of the test case, the characteristics of the output and output data, and the characteristics of the timing relationship of the test case.

[0062] 3) A coordinate axis is established, the abscissa of the coordinate axis is the tested integrated circuit and its peripheral interface module, and the ordinate is time. Each device on the abscissa corresponds to a vertical axis.

[0063] 4) Set the time axis where the integrated circuit and peripheral interface device under test are located, and set the timing and data task points according to the requirements of parallel timing and se...

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Abstract

The invention belongs to the technical field of integrated circuit testing, and particularly relates to an integrated circuit testing excitation generation system based on a modular excitation model.According to the integrated circuit testing excitation generation system based on the modular excitation model, a time axis configuration method is applied to produce task points corresponding to testcases, by configuring the task points, an excitation file containing the excitation model is formed, and the generation of excitation signals is realized. In addition, the task points are enabled tocorrespond to the test cases, and the visual management and batch execution of the test cases are realized. The contradiction of high labor cost and complex debugging in an existing scheme is solved,the configuration method is simple, and the integrated circuit testing excitation generation system is suitable for simulation testing such as ASIC, SOC and FPGA.

Description

technical field [0001] The invention belongs to the technical field of integrated circuit testing, and in particular relates to an integrated circuit test excitation generation system based on a modular excitation model. Background technique [0002] At present, when conducting integrated circuit testing, testers first write a test description document, which includes all test cases of the integrated circuit to be tested. Each test case describes the test purpose, test input data, test steps and expected test results. Take the test case of an FPGA software as an example, such as figure 1 shown. [0003] For FPGA software simulation testing, it is necessary to convert the above test cases into a language that can be recognized by the FPGA simulation execution tool so that it can be loaded into the simulation execution tool to perform simulation. At present, the implementation of test cases is in the code editing environment, and it takes a lot of manpower and time to reali...

Claims

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Application Information

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IPC IPC(8): G01R31/28
CPCG01R31/2851
Inventor 郑金艳张清李思陈朋刘军李娜安鹏伟魏伟波赵常张依漪张骢李昂陈盼张谦李晓伟
Owner 北京京航计算通讯研究所
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