Load balancing device and flying probe testing device with balancing device

A balancing device and load balancing technology, which is applied in the field of flying probe testing machines, can solve problems such as large torque of guiding devices, and achieve the effect of prolonging life

Pending Publication Date: 2018-12-18
POLAR LIGHT TECH CO LTD
View PDF9 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Therefore, the technical problem to be solved by the present invention is to overcome the defect that the driving device for installing the test head in the prior art produces a large torque to the guiding device due to the long cantilever of the test head, thereby providing a flying probe tester with a balance device. device

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Load balancing device and flying probe testing device with balancing device
  • Load balancing device and flying probe testing device with balancing device
  • Load balancing device and flying probe testing device with balancing device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0057] The present invention provides a plane flying probe testing machine and a test head balancing device for the flying probe testing machine, wherein the flying probe testing machine includes a base 1, and the base 1 is horizontally arranged, such as figure 1 The shown base 1 is a frame-shaped structure, the middle of which constitutes the test area 11 . Wherein, above and below the base 1, there are flying probe test devices with the same structure using the base 1 as the installation support base. The flying probe test device includes: a pair of X-axis assemblies 2 fixedly installed on the base 1, two sets of X-axis assemblies 2 are arranged on opposite sides of the base 1 in parallel, and the X-axis assemblies 2 guide the test head during the test. Movement along the X axis in area 11. Above the X-axis assembly 2, a Y-axis assembly 4 is arranged vertically across two groups of X-axis assemblies 2 and perpendicular to the X-axis assembly 2, and a rotating test head (not...

Embodiment 2

[0064] In the second embodiment of the present invention, the basic structure of the flying probe testing device is the same as that of the first embodiment, and the difference from the first embodiment lies in the arrangement of the balancing device. In the second embodiment, the balancing device includes a counterweight guide rail 13 arranged along the reverse extension line of the cantilever 9 , and a counterweight 14 slidable on the counterweight guide rail 13 . The counterweight guide rail 13 can be arranged and installed on the end of the connecting block 6 through a connecting member, and the counterweight guide rail 13 and the cantilever 9 are respectively arranged on both sides of the connecting block 6 . In the process of sliding connection between the counterweight 14 and the counterweight guide rail 13, by adjusting the distance between the counterweight 14 and the Y-axis linear module, the torque of the balance device on the Y-axis linear module can be adjusted, th...

Embodiment 3

[0066] In the third embodiment of the present invention, the basic structure of the flying probe testing device is the same as that of the above-mentioned embodiment, and the difference from the above-mentioned embodiment lies in the arrangement of the balance device and the arrangement of the Y-axis assembly. In this embodiment 3, the Y-axis assembly adopts the screw rod 15; and the balance device includes balance guide rails 5 arranged on both sides of the Y-axis screw rod and parallel to it, similar to the balance guide rails in embodiment 1, two balance guide rails The guide rails 5 are respectively arranged on both sides of the linear screw rod 15, and are set at a certain distance from the screw rod. Theoretically, the larger the distance between the two balance guide rails 5 and the Y-axis screw rod 15, the better the balancing effect they play, and In order to meet the use environment with high bearing strength, the balance guide rail in this embodiment also uses a roll...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A flying probe testing device comprising: a pair of X-axis assemblies, wherein the X-axis assemblies guide a test head to move along the X-axis in a horizontal test area; a Y-axis assembly, wherein the Y-axis assembly guides the test head to move along the Y-axis in a horizontal test area, two ends of the Y-axis assembly are respectively slidably connected to the two X-axis assemblies; the test head is disposed on one side of the Y-axis assembly; and a balance support device connected to the Y-axis assembly, wherein the balance support device applies an action torque to the Y-axis assembly opposite to a torque generated by the test head to the Y-axis assembly. The flying probe testing device provided by the invention reduces the torque of the load on the Y-axis assembly by setting up a balancing device, thereby extending the life of the Y-axis assembly and improving its radial accuracy.

Description

technical field [0001] The invention relates to the technical field of flying probe testing machines, in particular to a flying probe testing device with a balancing device. Background technique [0002] Electrical performance testing is a process that PCBs must go through in the manufacturing process. At present, flying probe testing machines are the mainstream testing equipment for testing PCB electrical properties by contact. At present, the testing requirements for flying probe testing machines in the market mainly include: precise motion control , reliable electrical performance, fast test efficiency and diverse test capabilities, and a good mechanical structure is the key to achieving test accuracy. [0003] The flying probe testing machine mainly includes a motor-driven probe that can move independently and quickly on the X-axis and Y-axis or a jig equipped with a dial, which is mainly realized by moving the probe in the Z-axis direction and PCB The solder joints of ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R1/067
CPCG01R1/06711G01R31/2801
Inventor 黄韬
Owner POLAR LIGHT TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap