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Full-aperture and full-field ray tracing method of catadioptric telescopic system

A ray tracing and telephoto system technology, applied in the field of full aperture full field of view ray tracing, can solve the problem that a single ray tracing method cannot be systematically and comprehensively evaluated, and achieve the effect of avoiding chance

Active Publication Date: 2018-12-18
CHANGCHUN UNIV OF SCI & TECH
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  • Abstract
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AI Technical Summary

Problems solved by technology

[0004] In order to solve the problem that the existing single ray tracing method cannot fully evaluate the system under partially polarized light conditions, the present invention proposes a catadioptric telescopic system full field of view and full aperture ray tracing method

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  • Full-aperture and full-field ray tracing method of catadioptric telescopic system

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Embodiment

[0086] A ray tracing method for full field of view and full aperture of a catadioptric telescopic system, comprising the following steps:

[0087] Step 1, establish the refraction and reflection Mueller matrix model of the optical system:

[0088] Step 2, read the basic data: connect MATLAB and ZEMAX through the dynamic data connection mechanism, read the catadioptric telescope in ZEMAX with a diameter of 710mm, an angle of view of 0.083°, and the refractive index of the lenses in relay lens group 2 are 1.806 in turn ;1.692;1.673;1.923;1.618;1.697;

[0089] Step 3: Select the light field of view: divide it into 9 layers through the boundary of the aperture and field of view, each layer is divided into 128 sampling points, and select one of the field of view to store in ZEMAX, so that only There is this field of view.

[0090] Step 4, set the pupil coordinates: under the condition that the field of view does not change, select points in the sampling points of the pupil coordi...

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Abstract

The invention discloses a full-aperture and full-field ray tracing method of catadioptric telescopic system, and belongs to the technical field of the optical system polarization characteristic analysis. For solving a problem that a system cannot be comprehensively evaluated under partial polarized light condition through the existing single-ray tracing method, the method comprises the following steps: establishing an optical system refraction and reflection Mueller matrix model; reading basic data; connecting MATLAB with ZEMAX through a dynamic data connection mechanism, reading the apertureand a field angle of the catadioptric telescopic in the ZEMAX and the refractivity basic index of a lens; selecting a ray field; equally dividing the ray field into n layers through the limit of the aperture and the field, wherein each layer is equally divided into m sampling points, and selecting one field to save in the ZEMAX; setting a pupil coordinate; computing a Muller matrix; changing the pupil coordinate; changing the field until all field sampling points are completely computed; and finally obtaining the emergent Strokes vector and polarization degree of the full-field full-aperture of the optical system.

Description

technical field [0001] The invention belongs to the technical field of polarization characteristic analysis of an optical system, and in particular relates to a full-aperture full-field ray tracing method of a catadioptric telescopic system. Background technique [0002] With the continuous development of space technology, more than 18,000 space targets can be tracked. Among them, 4,763 space objects are in-orbit spacecraft, and the rest are space debris. Space debris seriously threatens the safety of spaceflight in orbit, and their collision with the spacecraft can directly change the surface properties of the spacecraft and cause the failure of the spacecraft system. There is an urgent need for on-orbit detection and identification of satellites and debris. Traditional intensity or spectral detection methods are susceptible to cosmic radiation interference, and the detection and identification effects are not good. Polarization has obvious advantages in the detection an...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
CPCG01M11/02G01M11/0228
Inventor 史浩东王稼禹李英超王超
Owner CHANGCHUN UNIV OF SCI & TECH
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