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Light filter structure and image sensor

A technology of image sensor and filter layer, which is applied in the direction of instruments, optics, measuring devices, etc., and can solve problems such as filter offset

Active Publication Date: 2018-12-07
VISERA TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, traditional optical filters are usually manufactured by multi-layer film interference technology. When the incident light with a large oblique angle falls on the traditional optical filter, there will always be blue-shifting (blue-shifting) phenomenon. On conventional filters, the blue shift shifts the spectrum of the conventional filter towards lower wavelength bands

Method used

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  • Light filter structure and image sensor
  • Light filter structure and image sensor
  • Light filter structure and image sensor

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Embodiment Construction

[0027] The light filtering structures and image sensors of some embodiments of the present disclosure will be described in detail below. It should be appreciated that the following description provides many different embodiments or examples for implementing different aspects of some embodiments of the present disclosure. The specific components and arrangements described below are only for simple and clear description of some embodiments of the present disclosure. Of course, these are only examples rather than limitations of the present disclosure. Furthermore, repeated reference numerals or designations may be used in different embodiments. These repetitions are only for simply and clearly describing some embodiments of the present disclosure, and do not mean that there is any relationship between the different embodiments and / or structures discussed. Furthermore, when it is mentioned that a first material layer is located on or above a second material layer, it includes th...

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Abstract

According to the embodiment of the invention, the present invention provides a light filter structure is provided. The light filter structure includes a first filter layer disposed over the substrate.The first filter layer has a transmittance greater than 50% in a first waveband, wherein the first filter layer is an interference-type filter. The light filter structure further includes a second filter layer disposed over the substrate. The second filter layer has a transmittance greater than 50% in a second waveband, wherein the second filter layer is an absorption-type filter. The first waveband partially overlaps the second waveband at the wavelength in a third waveband, and the third waveband is in an IR region. Furthermore, an image sensor used as a time-of-flight image sensor is alsoprovided.

Description

technical field [0001] The present invention relates to a filter structure, in particular to applying the filter structure to a time-of-flight (ToF) image sensor. Background technique [0002] At present, time-of-flight (ToF) technology has been widely used in modern industry, and it can provide three-dimensional (three-dimensional) by combining complementary metal oxide semiconductor (CMOS) pixel array and adjustable light source; 3D) images. Three-dimensional time-of-flight (3D ToF) cameras have been used in many different applications, such as contour inspection of manufactured goods, verification of computer aided design (CAD), geographic surveying, and object imaging. [0003] The operation of the three-dimensional time-of-flight (3D ToF) camera is to use an adjustable light source to illuminate the scene, observe the light reflected by the scene, measure the phase shift between the light and the reflection, and convert this phase shift into a distance. Realize three-...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L27/146G01S17/89
CPCH01L27/14621G01S7/4816G01S17/89G02B5/208G02B5/281
Inventor 王唯科陈裕仁吴佳惠
Owner VISERA TECH CO LTD
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