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One-dimensional nanomaterial-based detection method

A technology of nanomaterials and detection methods, applied in the field of nano-optics, can solve the problems of low resolution of detection local electric field density, and achieve the effect of improving resolution and solving high-resolution detection of local electric field density

Active Publication Date: 2018-12-07
INST OF PHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0004] The purpose of the present invention is to provide a detection method based on one-dimensional nanomaterials to solve the problem of relatively low resolution of detecting local electric field density in the prior art

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[0058] Metallic structures can interact strongly with light, a phenomenon called surface plasmon resonance, and the surface plasmon unit is the coupling of metal free electron collective oscillations with electromagnetic fields. Surface plasmons usually have two modes, one is the surface plasmon excitons that can propagate on the flat interface, and the other is confined to the surface of metal nanostructures (such as noble metal nanoparticles). Localized surface plasmon primitives that exist in the form of waves. The frequency, intensity, and peak shape of the localized surface plasmon resonance are very sensitive to the dielectric properties (that is, materials), size, shape, and dielectric environment of the nanostructure. People can design different metal nanostructures To control the local surface plasmon resonance, in order to realize the manipulation of light at the sub-wavelength scale, the plasmon photonics based on this has become a very active subject in recent year...

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Abstract

The invention provides a one-dimensional nanomaterial-based detection method for detecting a local electric field of a plasmon in a micro-nano structure, and relates to the technical field of nano-optics. The detection method comprises the following steps: preparing the micro-nano structure and the one-dimensional nanomaterial, and compounding the micro-nanostructure with the one-dimensional nanomaterial; acquiring surface-enhanced Raman spectra of the one-dimensional nanomaterial in the micro-nanostructure in different polarization directions to obtain a polarization dependency of the surface-enhanced Raman spectrum intensity of a characteristic peak of the one-dimensional nanomaterial; and obtaining a local Raman enhancement factor according to the polarization dependency and a positional relationship between the one-dimensional nanomaterial and the micronano structure in order to obtain the local electric field intensity of the plasmon. The problem of low resolution of detection ofthe local electric field density in the prior art is solved in the invention.

Description

technical field [0001] The invention relates to the field of nano-optic technology, in particular to a detection method based on one-dimensional nano-materials. Background technique [0002] One of the most important features of the localized surface plasmon is that it can bind the light beam in a small space while producing a large electromagnetic field enhancement effect. Using its localized effect, the interaction between light and matter can also be greatly enhanced. Therefore, it is of great significance to detect the local electric field strength in metal micro-nanostructures for the study of local surface plasmon units. Researchers usually use theoretical simulation methods to calculate the local electric field strength in metal micro-nanostructures. Although the theoretical calculation structure can be in good agreement with the experimental results, it is still not possible to take all factors into consideration to achieve an accurate characterization of the local e...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/65
CPCG01N21/658
Inventor 杨丰周维亚王艳春解思深
Owner INST OF PHYSICS - CHINESE ACAD OF SCI
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