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Three-dimensional vector directional diagram acquisition method and planar near-field antenna measurement method

A technology of three-dimensional vector and acquisition method, applied in the field of antenna measurement, can solve the problems of large calculation amount of three-dimensional vector pattern and difficult to meet engineering requirements, and achieve the effect of avoiding data calculation, reducing the amount of calculation, and improving calculation efficiency.

Active Publication Date: 2018-11-23
XIDIAN UNIV
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Problems solved by technology

[0009] The present invention provides a method for acquiring a three-dimensional vector pattern and a method for measuring a planar near-field antenna, which solves the problem of the huge amount of calculation required to obtain the three-dimensional vector pattern of the probe at the measured frequency point in the prior art when the measurement accuracy is met , technical problems that are difficult to meet engineering requirements

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  • Three-dimensional vector directional diagram acquisition method and planar near-field antenna measurement method
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  • Three-dimensional vector directional diagram acquisition method and planar near-field antenna measurement method

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Embodiment Construction

[0039] The embodiment of the present application provides a method for obtaining a three-dimensional vector pattern and a method for measuring a planar near-field antenna to solve the problem in the prior art of obtaining the three-dimensional vector pattern of the probe at the measured frequency point under the condition that the measurement accuracy is satisfied. The amount of calculation is huge, and it is difficult to meet the technical problems of engineering requirements.

[0040] In order to better understand the above technical solutions, the above technical solutions will be described in detail below in conjunction with the accompanying drawings and specific implementation methods. It should be understood that the embodiments of the present invention and the specific features in the embodiments are detailed descriptions of the technical solutions of the present application. , rather than limiting the technical solutions of the present application, the embodiments of th...

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Abstract

The invention belongs to the technical field of antenna measurement, and discloses a three-dimensional vector directional diagram acquisition method which comprises the following steps: acquiring thepartition geometric model of a measurement probe; the electric field distribution on the sphere surrounded by the near region is calculated by using the high-order moment method based on the partitiongeometric mode; and the three-dimensional vector directional diagram of any point in the far field of the probe is obtained by spherical near-far field transformation based on the electric field distribution. The method capable of reducing the calculation amount under the condition of ensuring the accuracy of the three-dimensional vector directional diagram is provided.

Description

technical field [0001] The invention relates to the technical field of antenna measurement, in particular to a method for acquiring a three-dimensional vector pattern and a method for measuring a plane near-field antenna. Background technique [0002] The general process of antenna near-field measurement is as follows: place the antenna to be tested in a dark room, and then use a small probe with known characteristics to scan on a surrounding surface 3 to 10 wavelengths away from the antenna to be tested to obtain the near-field electromagnetic field of the antenna The data, and then through the near-far-field transformation algorithm to obtain the far-field characteristics of the antenna. [0003] According to the shape of the scanning surrounding surface, the near-field measurement is generally divided into planar near-field measurement, cylindrical near-field measurement and spherical near-field measurement; and all three measurement techniques need to use complex probe c...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R29/10
CPCG01R29/10
Inventor 袁浩波吴征国周虹光侯建强
Owner XIDIAN UNIV
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