Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Delay calibration parameter determination method and device, electronic equipment and storage medium

A technology for calibrating parameters and determining methods, applied in the field of data processing, can solve problems such as difficulty, time-consuming and labor-intensive, and difficult to achieve ideal results, and achieve the effect of optimizing the determination method, improving the determination efficiency, and accurately determining

Active Publication Date: 2018-11-16
TRANSCOM INSTR
View PDF5 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In the process of implementing the present invention, the inventor found that the prior art has the following defects: when the number of data ports requiring delay adjustment is large, and there are many alternative delay values ​​corresponding to the data ports, each data port The number of delay adjustment schemes is too large. It is very difficult, time-consuming and labor-intensive to find a suitable value only manually. It requires a lot of attempts, and it is difficult to achieve the desired result.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Delay calibration parameter determination method and device, electronic equipment and storage medium
  • Delay calibration parameter determination method and device, electronic equipment and storage medium
  • Delay calibration parameter determination method and device, electronic equipment and storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0035] figure 1 It is a flow chart of a method for determining a delay calibration parameter provided by Embodiment 1 of the present invention. This embodiment is applicable to the situation of determining delay calibration parameters of multiple data ports to be calibrated, and is especially suitable for a data port to be calibrated The case where there are multiple corresponding candidate delay values. The method can be performed by a device for determining a delay calibration parameter, which can be implemented by software and / or hardware, and generally can be integrated in a computer device (for example, a terminal or a server, etc.) for determining a delay calibration parameter. ), the method includes the following operations:

[0036] S110. Construct a Monte Carlo tree of delay values ​​according to the set of candidate delay values ​​corresponding to the data port to be calibrated, and nodes at each layer of the Monte Carlo tree correspond to candidate delay values ​​o...

Embodiment 2

[0057] figure 2 It is a flowchart of a method for determining delay calibration parameters provided by Embodiment 2 of the present invention. This embodiment is embodied on the basis of the above embodiments. In this embodiment, the data port to be calibrated is embodied as: The digital output port with a fixed number of digits in the digital converter, and the reference clock pulse output port; at the same time, according to the set of alternative delay values ​​corresponding to the data port to be calibrated, the Monte Carlo tree of the delay value will be constructed, and according to the The delay value of the value acquisition path iterated in the Monte Carlo tree is adjusted to the delay value required by each of the data ports to be calibrated to output the standard test signal, and the specific realization method of the target value acquisition path is obtained. Correspondingly, the method of this embodiment may include:

[0058] S210. Establish a root node according...

Embodiment 3

[0092] image 3 It is a flowchart of a method for determining delay calibration parameters provided by Embodiment 3 of the present invention. This embodiment is embodied on the basis of the above-mentioned embodiments. In this embodiment, the analog-to-digital converter is specifically a dual-channel analog-to-digital converter The converter has two channels for receiving mutually orthogonal real part signals and imaginary part signals obtained after demodulation of the standard test signal; the standard test signal is a sine wave whose signal frequency is set to be less than a preset frequency threshold; at the same time, The specific implementation method of obtaining the signal estimation corresponding to the current iterative path according to the similarity between the digital signal transmission result and the standard test signal is further specified. Correspondingly, the method of this embodiment may include:

[0093] S310. Construct a Monte Carlo tree of delay values...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The embodiment of the invention discloses a delay calibration parameter determination method and device, electronic equipment and a storage medium. The method comprises the steps that according to analternative delay value set corresponding to to-be-calibrated data ports, a Monte Carlo tree of delay values is constructed, wherein nodes on each layer of the Monte Carlo tree correspond to alternative delay values of the same to-be-calibrated data port; according to delay values of iterative value paths in the Monte Carlo tree, delay values needed for all the to-be-calibrated data ports to output standard test signals are adjusted, and a target value path is obtained; and according to all the nodes included in the target value path, delay values corresponding to all the to-be-calibrated dataports are determined. Through the technical scheme in the embodiment, the technical effect of determining delay calibration parameters automatically, efficiently, rapidly and accurately is achieved,no manpower cost investment is needed, an existing delay calibration parameter determination mode is optimized, and the determination efficiency of the delay calibration parameters is improved.

Description

technical field [0001] The embodiments of the present invention relate to the technical field of data processing, and in particular, to a method, device, electronic device, and storage medium for determining delay calibration parameters. Background technique [0002] At present, with the continuous development of various high-precision and highly integrated equipment, how to realize the delay calibration between each chip in the equipment and the delay calibration between each data port in the same chip has become a very important research nowadays. topic. [0003] For example, in the design and manufacture of instrumentation technology, it is often necessary to realize the reception of radio frequency signals, which requires the use of ADC (Analog-to-Digital Converter, analog-to-digital converter) to convert the analog signal into a digital signal, and then enter the FPGA (Field- Programmable Gate Array, Field Programmable Gate Array) to process or analyze digital signals....

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
CPCG06F30/00
Inventor 刘景鑫蒋政波
Owner TRANSCOM INSTR
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products