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Polarization four-step phase shifting method for digital speckle interferometry

A four-step phase shifting and digital speckle technology, applied in the direction of optical devices, measuring devices, instruments, etc., can solve the problems of high and low frequency spectrums that are difficult to automate accurately and speckle images are unstable, and achieve accurate random phase extraction and avoid hysteresis Effect

Inactive Publication Date: 2018-11-16
BEIJING INFORMATION SCI & TECH UNIV
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Problems solved by technology

The space phase shift method and the space carrier method can realize dynamic deformation measurement, but the images collected at different positions of the former need to be strictly calibrated, and the separation of high and low frequency spectrum in the latter is difficult to achieve accurate automation. Therefore, the time phase shift method is currently widely used phase extraction method
In actual engineering, the time phase shift method generally generates a fixed phase difference through the movement of piezoelectric ceramics, but due to the hysteresis, nonlinearity and creep characteristics of piezoelectric ceramics, the collected speckle images are unstable.

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  • Polarization four-step phase shifting method for digital speckle interferometry
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  • Polarization four-step phase shifting method for digital speckle interferometry

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Embodiment Construction

[0026] The objects and functions of the present invention and methods for achieving the objects and functions will be clarified by referring to the exemplary embodiments. However, the present invention is not limited to the exemplary embodiments disclosed below; it can be implemented in various forms. The essence of the description is only to help those skilled in the relevant art comprehensively understand the specific details of the present invention.

[0027] Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. In the drawings, the same reference numerals represent the same or similar components, or the same or similar steps.

[0028] The present invention is a polarization four-step phase shift method for digital speckle interference technology, the method comprising:

[0029] A. The steps of constructing a polarization four-step phase shifting device for digital speckle interference;

[0030] B. the step of ut...

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Abstract

The invention discloses a polarization four-step phase shifting method for digital speckle interferometry. According to the polarization four-step phase shifting method for digital speckle interferometry, polarization beam splitting prisms, a beam expander, quarter wave plates and polarizers are adopted to establish a polarization four-step phase shifting optical path; in a phase shifting process,two polarizers are rotated, so that 0-degree, 90-degree, 180-degree and 270-degree four-step phase shifting can be realized, and corresponding speckle images are acquired; and a random phase field atan initial moment is restored through a four-step phase shifting algorithm. Compared with a traditional time phase shifting method, the method replaces piezoelectric ceramics with two rotatable polarizers, and therefore, the hysteresis, nonlinearity and creep interference of the piezoelectric ceramics can be avoided, stable speckle images can be acquired, and accurate random phase extraction canbe realized.

Description

technical field [0001] The invention relates to the technical field of digital speckle interference, in particular to a polarization phase shift method for digital speckle interference technology. Background technique [0002] The digital speckle interferometry technology utilizes the mutual interference between the reference light and the light diffusely reflected on the surface of the object to generate a speckle image, and realizes the deformation measurement of the object surface by measuring the interferometric phase change before and after the object is loaded and deformed. It has non-contact, large measurement range and sensitivity It has a wide range of applications in three-dimensional deformation of materials and structures, stress-strain measurement and vibration analysis. In order to measure object deformation, how to extract random phase from speckle image is one of the key technologies of digital speckle interferometry. At present, the commonly used phase extr...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/16G01B9/02
CPCG01B9/02083G01B11/168
Inventor 李伟仙李露董明利吴思进
Owner BEIJING INFORMATION SCI & TECH UNIV
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