Modelling method of strip-shaped single-particle imaging noise

A modeling method and single-particle technology, applied in image analysis, image data processing, instruments, etc., can solve problems such as pixel damage, achieve the effect of improving similarity, improving test adequacy, and expanding the coverage of working conditions

Active Publication Date: 2018-11-13
BEIHANG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The effect of a single event destruction is pixel damage, which is often perman

Method used

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  • Modelling method of strip-shaped single-particle imaging noise
  • Modelling method of strip-shaped single-particle imaging noise

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Embodiment Construction

[0016] The present invention is described in more detail below:

[0017] The energy of a single particle in space is definite, and the number of pixels affected by the single particle varies with the incident angle of the single particle entering the imaging chip front. The smaller the incident angle is, the more pixels are involved, the more energy is dispersed, and the maximum gray value of pixels will be attenuated.

[0018] The input parameters of the model include: the incident angle relative to the imaging chip front, the azimuth angle, the incident point, the length of the straight line segment of the trajectory, and the maximum gray scale reference value (related to the energy and pixel sensitivity of the single particle).

[0019] There are three implementation methods,

[0020] method one:

[0021] (1) For each implicated pixel, the trajectory line and the pixel are cut to obtain two parts of the area, and the area of ​​the smaller part is taken;

[0022] (2) Calc...

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Abstract

The invention provides a modelling method of strip-shaped single-particle imaging noise. The content is as follows: the single-particle slantly shines to an imaging chip, so that the implicated pixelalong the single-particle linear trajectory is in high-gray value or saturation; the gray assignment of the trajectory implicated pixel is based on the area of the smaller part after cutting the pixelalong the trajectory; when the linear trajectory passes through a pixel center, the gray assignment is the highest; the linear trajectory passes through the pixel angular point, and the gray assignments of the pixels at two sides are the lowest; or the square value of the length, cut by the pixel, of the trajectory line is used as the basis of the gray assignment, or the length value, cut by thepixel, of the trajectory line is used as the basis of the gray assignment. The single-particle noise imaging generated through the method disclosed by the invention and the simulated image are superposed as the input, the simulation experiment is performed for a camera or a star sensor, the similarity of the single-particle interference imaging working condition simulation can be improved, the working condition coverage range of the model testing is enlarged, and the testing sufficiency of the camera or the star sensor embedded system is improved.

Description

(1) Technical field [0001] The invention belongs to the field of image analysis and modeling, in particular to a modeling method of strip-shaped single-particle noise. (2) Background technology [0002] Typical effects of single event phenomena are wreck, latch and flip. [0003] The effect of a single event destruction is pixel damage, which is often permanent, resulting in "dead pixels" on the imaging chip's pixel array, with a gray value of 0. It is easy to simulate the single particle destruction effect, and it can be directly regarded as the generation of "bad pixels". [0004] When the single event latch-up phenomenon occurs, a low-resistance channel can be formed between the power supply and the ground of the device, so that the device enters a high current maintenance state that is several times the normal operating current. burn. [0005] The single event reversal is a transient effect. The single event reversal imaging is generated in the current frame image. Si...

Claims

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Application Information

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IPC IPC(8): G06T7/12G06T7/62
CPCG06T7/12G06T7/62
Inventor 王海涌田国元朱宏玉王可东
Owner BEIHANG UNIV
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