Film micropore defect detection system

A defect detection and microporous technology, applied in measurement devices, material analysis by electromagnetic means, instruments, etc., can solve problems such as uncontrollable, film surface damage, and no external output signal, and achieve the effect of avoiding damage

Pending Publication Date: 2018-10-16
上海颀普静电科技有限公司
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  • Abstract
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Problems solved by technology

[0003] In the patent with the existing patent number CN102539482A, a technology is mentioned in which a flexible conductive layer is squeezed into the micropores, electrically contacted with another conductor to realize conduction, and the current change generated in the measurement circuit is used to detect the micropore defects of the film. In this patented technology, a flexible material is used to squeeze into the micropores for testing, which will squeeze and rub the film, which may cause damage to the surface of the film, and there is no external output signal, and there is no corresponding signal when micropores are detected. Feedback, unable to make timely control when micropores are detected

Method used

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Embodiment Construction

[0019] The technical solution of this patent will be further described in detail below in conjunction with specific embodiments.

[0020] Embodiments of the present patent are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are only used for explaining the patent, and should not be construed as limiting the patent.

[0021] In the description of this patent, it is to be understood that the terms "center", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", The orientation or positional relationship indicated by "top", "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing this patent and simplifying the des...

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Abstract

The invention provides a film micropore defect detection system and belongs to the field of product quality detection. A discharging roller is located between a right equipment wallboard and a left equipment wallboard, a sensing roller is fixedly mounted between the right equipment wallboard and the left equipment wallboard and located right below the discharging roller, a transition roller a is fixedly mounted between the right equipment wallboard and the left equipment wallboard, a power supply is fixedly mounted on the left side of the left equipment wallboard, and a transition roller b isfixedly mounted between the right equipment wallboard and the left equipment wallboard. The film micropore defect detection system can detect film micropore detects under the condition that films arenot touched, damage of traditional detection devices to the films in the detection process can be effectively avoided, meanwhile, an execution circuit is arranged and can output a signal when detecting a micropore to control corresponding external equipment, and the function of controlling equipment operation in real time is realized.

Description

technical field [0001] The invention relates to a film detection device, in particular to a film micropore defect detection system. Background technique [0002] Today, with the rapid development of science, a large number of thin films with various functions have been widely used. As an important material, thin films occupy an increasingly important position in the field of materials. With the continuous improvement of plastic processing and modification technology , the application field is expanding rapidly, and the requirements for plastic materials, surface decoration and adhesive performance in different application fields are increasing. In order to improve the appearance of the plastic surface and prolong the service life of the plastic, it is necessary to carry out various treatments on the surface of the plastic parts. In the film In the production process, there will be microporous defects in the film due to various reasons. Therefore, the detection of microporous...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N27/00G01N27/62
CPCG01N27/00G01N27/62
Inventor 昝鹏郝少平
Owner 上海颀普静电科技有限公司
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