A Normal Incidence Fresnel Optical Characterization Method for Two-dimensional Materials

Abstract

The normal-incidence Fresnel optical characterization method for two-dimensional materials provided by the present invention adopts the traditional basic theory of optical thin films-conduction matrix method, introduces the concept of optical admittance, and deduces the absorption, The simple calculation formulas of reflectivity and transmittance, and the derivation process are simple, which is conducive to the application of two-dimensional materials in the field of optoelectronics.

Description

technical field [0001] The invention relates to the fields of optical thin films and two-dimensional materials, in particular to a normal-incidence Fresnel optical characterization method for two-dimensional materials. Background technique [0002] In 2004, two scientists from the University of Manchester, Andre Geim and Konstantin Novoselov, successfully prepared single-layer graphene (thickness 0.335nm), which opened the second A new era of dimensional materials research. Since then, the optical, electrical, and magnetic properties of graphene have been extensively studied. In the study of the optical properties of graphene, two models have been used. One is the film model, that is, graphene is considered as a film, even if its thickness is only as thin as one atomic layer, this model is mainly used to study the optical constants of two-dimensional materials such as graphene; the other is the interface model, that is Taking graphene as an interface or boundary with an i...

AI Technical Summary

Problems solved by technology

However, two-dimensional materials are essentially thin films with a thickness of only a few angstroms. If the interface model is used to calculate its optical properties, the traditional optical thin film theory and commercial optical thin film software will lose their effectiveness.

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