Programmable state sequence dynamic generation system of direct current tester
A technology of programming status and dynamic generation, which is applied to the parts, instruments, and measuring electronics of electrical measuring instruments, can solve problems such as lack of testing techniques and means, difficulty in meeting testing requirements, large and complex testing systems and equipment, etc., to meet The effect of testing requirements
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[0032] The present invention will be further described below. The following examples are only used to illustrate the technical solution of the present invention more clearly, but not to limit the protection scope of the present invention.
[0033] Such as figure 1 As shown, the dynamic generation system of the programmable state sequence of the DC tester of the present invention includes a three-layer architecture, namely, an interaction layer, a control layer and an output layer.
[0034] Inputting the requirements of testers at the interactive layer includes two means of N-S (Nassi Shneiderman) diagram input and fault model library input, and testers can choose any one of the means to input. The N-S diagram enters the timing of each state, the execution conditions and cycle conditions of each state, and is a means of programming the state. Through the N-S diagram, the execution conditions and timing of various states in the input state sequence, as well as the output curren...
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