Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

High-speed pantograph key parameter identification method based on sensitivity analysis

A sensitivity analysis and identification method technology, applied in the field of high-speed pantograph key parameter identification based on sensitivity analysis, can solve the problems of not considering the influence degree of pantograph, the optimization target is too general, and the cost is increased.

Inactive Publication Date: 2018-06-29
SOUTHWEST JIAOTONG UNIV
View PDF7 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in the existing high-speed pantograph parameter optimization schemes, the influence of different design parameters of the high-speed pantograph on the pantograph-catenary sliding contact characteristics is not considered in the analysis.
In the process of parameter optimization design, the optimal design of the overall parameters of the high-speed pantograph can certainly improve the current quality of the high-speed pantograph-catenary system. Optimize the performance of high-speed pantograph to the best

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High-speed pantograph key parameter identification method based on sensitivity analysis
  • High-speed pantograph key parameter identification method based on sensitivity analysis
  • High-speed pantograph key parameter identification method based on sensitivity analysis

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0087] The present invention will be described in further detail below in conjunction with the accompanying drawings and specific embodiments. This embodiment uses the Sobol' global sensitivity analysis method to deduce and calculate the first-order sensitivity value, second-order sensitivity value and total sensitivity value of the high-speed pantograph structure parameters to the bow head motion trajectory, and analyze different high-speed pantograph structure parameters The impact on the dynamic lifting displacement of the high-speed pantograph, so as to determine the key structural parameters that affect the quality of the high-speed pantograph-catenary flow. The method flow is as follows figure 1 As shown, the specific content and design method steps are as follows:

[0088] Step 1: Replace the traditional mass model with the nonlinear motion model of the high-speed pantograph, and introduce the gap error of the kinematic pair into it. The geometric relationship diagram ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a high-speed pantograph key parameter identification method based on sensitivity analysis. A Sobol' global sensitivity analysis method is adopted, a first-order sensitivity value, a second-order sensitivity value and a total sensitivity value of high-speed pantograph structural parameters for a pantograph bow motion track are deducted, the influence of different high-speedpantograph structural parameters on the high-speed pantograph dynamic lifting displacement is analyzed, and thus key structural parameters of the high-speed pantograph net current collection quality are determined; then which design parameters are the most effective is determined, and design parameters are reasonably selected. Compared with a traditional high-speed pantograph optimization and design method, the optimization and design process can be greatly simplified to improve the slide contact property of a high-speed pantograph net by the greatest margin.

Description

technical field [0001] The invention relates to the technical field of high-speed pantograph parameter identification, in particular to a method for identifying key parameters of high-speed pantographs based on sensitivity analysis. Background technique [0002] The pantograph-catenary relationship of high-speed railways is one of the important factors affecting the safe and reliable operation of railways, and the optimal design of catenary and high-speed pantograph parameters has always been the research focus of high-speed pantograph-catenary relationship. In order to improve the current quality of high-speed pantograph-catenary catenary, some literatures have proposed the optimization scheme of catenary design parameters. For example, Song Yang et al. proposed a 3D catenary model establishment method, which can be solved nonlinearly under the condition of wind deflection. However, most of these schemes need to rebuild the catenary in implementation, which requires high co...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F17/50
CPCG06F30/20G06F2119/06
Inventor 张静段甫川程肥肥刘志刚
Owner SOUTHWEST JIAOTONG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com