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Parameter determining method for compound leveling instrument

A composite level and parameter measurement technology, applied in the field of measurement, can solve the problems of low measurement efficiency, limited measurement terrain environment, influence measurement efficiency, etc., and achieve the effect of improving measurement efficiency

Active Publication Date: 2018-06-15
DALIAN SENBIOR SURVEYING INSTR TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The shortcomings of the traditional level are: (1) low measurement efficiency and reliability
Realizing the reasonable allocation of the position between the three points of the leveling instrument and the leveling rod in a complex terrain environment often consumes a lot of energy and time of the surveyors, which affects the measurement efficiency
(2) The measurement is limited by the terrain environment
[0004] In order to cooperate with the use of compound levels, the Chinese invention patent No. 201310049994.1 "leveling measurement method suitable for compound levels" discloses how to measure and correct the remaining i-angle of the compound level, how to correct and eliminate the influence of the remaining i-angle on the measured value However, this method has the following deficiencies: (1) If you directly use the pointer as a mark and measure the height of your own side through a ruler, on the one hand, there is an error because it is difficult to accurately determine the collimating axis position of the other side's altimeter (telescope) , on the other hand, it is also affected by the zero point difference of the local scale; (2) If a vertical electronic distance measuring device such as a macro camera, laser or infrared rangefinder, or an absolute linear grating is used to obtain the height of the local side, not only the cost is high, but also the There is an installation matching error with the collimation axis position of the telescope, and there is also the influence of the zero point difference of the local scale
However, in the application practice of the composite level, it is found that the instrument parameter determination method of the above-mentioned patent application requires two exchange measurements to complete the determination, which is time-consuming and laborious, and the determination efficiency is low.

Method used

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  • Parameter determining method for compound leveling instrument
  • Parameter determining method for compound leveling instrument
  • Parameter determining method for compound leveling instrument

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Embodiment 1

[0032] Composite level instrument parameter measuring method of the present invention, carry out according to the following steps:

[0033] a. If figure 1 As shown, the composite level A and the composite level B are the same as the prior art, and are composed of a leveling rod 1 and the other party's height measuring device (telescope) 2, etc., and the difference from the prior art is that the composite level A and the composite level B A plane reflector 3 parallel to the scale surface (including coplanar with the scale) is installed next to the scale, and the shape of the plane reflector 3 is preferably similar to the shape of the scale on the composite level A and composite level B;

[0034] b. Select two ground points x and z in a flat place, then place composite level A at ground point x, and composite level B at ground point z. The horizontal distance between ground point x and z is Simultaneously level the compound level A and the compound level B, and make the collim...

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Abstract

The invention discloses a parameter determining method for a compound leveling instrument. The parameter determining method comprises the following steps: mounting a plane mirror parallel to a scale surface beside a scale of the compound leveling instrument; secondly, selecting two ground points x and z at the plain land and respectively arranging a compound leveling instrument A and a compound leveling instrument B at the x and the z; meanwhile, leveling the compound leveling instrument A and the compound leveling instrument B, enabling collimation axes of respective opposite height finders to collimate own scales through the mirrors on the opposite compound leveling instruments, and observing and reading divisional scale data of own scales; keeping the compound leveling instrument B immobile, moving and arranging the compound leveling instrument A at the ground point y, simultaneously leveling the compound leveling instrument A and the compound leveling instrument B, enabling the collimation axes of the respective opposite height finders to collimate the own scales through the mirrors on the opposite compound leveling instruments, and observing and reading the divisional scale data of own scales; finally, calculating angles i of the compound leveling instruments and the heights H of the height finders according to measured data.

Description

technical field [0001] The invention belongs to the technical field of measurement, and in particular relates to a method for measuring parameters of a composite level instrument which improves measurement efficiency. Background technique [0002] At present, there are two types of equipment used in leveling: traditional level and composite level. [0003] The characteristic of the traditional level is that the ruler and instrument are separated, and one level and two leveling rods are used together. When measuring, first place the two leveling rods on the ground at points A and B respectively, then set the level at the middle position of the two points A and B, and use the horizontal line of sight of the leveling instrument telescope to read the two points respectively. The elevation value of the leveling rod, and the difference between the measured elevation values ​​is the level difference between the two points A and B on the ground. The deficiencies of the traditional...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01C5/00
CPCG01C5/00
Inventor 刘尧吴祥华孟强刘雁春
Owner DALIAN SENBIOR SURVEYING INSTR TECH CO LTD
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