A Method for Optimizing the Accelerated Degradation Test Scheme of Electrical Connectors

An accelerated degradation test, electrical connector technology, applied in the direction of instruments, measuring electricity, measuring electrical variables, etc., can solve problems such as the volatility of electrical connectors

Active Publication Date: 2020-03-17
ZHEJIANG SCI-TECH UNIV
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  • Abstract
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Problems solved by technology

Through the previous research, it was found that the performance degradation process of the electrical connector has the characteristics of fluctuation, and the distribution of contact spots on the contact pair and the generation of oxidized corrosion products are random.

Method used

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  • A Method for Optimizing the Accelerated Degradation Test Scheme of Electrical Connectors
  • A Method for Optimizing the Accelerated Degradation Test Scheme of Electrical Connectors
  • A Method for Optimizing the Accelerated Degradation Test Scheme of Electrical Connectors

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Embodiment Construction

[0067] The present invention will be further described below.

[0068] A method for optimizing an accelerated degradation test scheme of an electrical connector, the specific steps are as follows:

[0069] Step 1. According to the type of electrical connector to be tested, query the manual of the corresponding type of electrical connector, and determine the failure threshold D of the electrical connector (which is a resistance value, and the resistance of any contact pair of the electrical connector is greater than the failure threshold D When, the electrical connector is regarded as failure), the working life t g , the working temperature range of the electrical connector, the storage temperature range of the electrical connector and the shell material of the electrical connector to be tested. Determine the minimum test temperature T z and storage temperature T 0 , the lowest test temperature T z In the working temperature range of the electrical connector, the storage te...

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Abstract

The invention discloses an optimization method of a degeneration acceleration test scheme of an electric connector. The sample size used in a stress-constant degeneration acceleration test and the distribution ratio of samples in different tests influence a test result. The method comprises the concrete steps that 1) the working life tg, the storage environment temperature T0, the lowest test temperature Tz, the highest test temperature Tm and the cutoff time tau of the electric connector are determined; 2) a random process degeneration model of median life of the electric connector is established; 3) m electric connectors to be detected are taken for primary test to obtain parameters a, b, gamma0 and gamma 1 to be evaluated; 4) an optimized target function is determined; and 5) the test temperature and sample distribution ratio of each test are determined. According to the optimization method, the sample distribution ratio of each test is optimized, and the storage life is estimated in higher precision compared with a traditional test scheme in which samples are distributed equivalently under the same total sample size, the same cutoff time, and the same test interval.

Description

technical field [0001] The invention belongs to the technical field of electrical connector degradation tests, and in particular relates to an optimization method for an accelerated degradation test scheme of electrical connectors. Background technique [0002] As a basic electromechanical component for transmitting signals and electric energy on model equipment, electrical connectors play a vital role in the connection and separation between equipment and the ground, between units and between systems. Failure of any one electrical connector can lead to paralysis of the entire model equipment. Therefore, it is of great significance to accurately evaluate the storage reliability of electrical connectors for the reliability evaluation of model equipment. [0003] Electrical connectors will be affected by environmental stress during storage. In order to quickly assess the reliability level of the product in the actual working environment, it is necessary to conduct accelerated...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
CPCG01R31/003
Inventor 钱萍陈磊磊陈文华钟立强孟垣东叶杰辉夏宏运颜佳辉张利彬
Owner ZHEJIANG SCI-TECH UNIV
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