Method and device for rapidly filtering surface dust in panel detection

Abstract

The invention discloses a method and a device for rapidly filtering surface dust in panel detection. The method includes the steps of acquiring a first detection picture with the dust on the upper surface of a panel as bright spots or bright specks; judging the covering amount of dust on the upper surface of the panel, filtering the dust directly if the dust coverage amount is small, filtering thedust of large particles if the dust coverage amount is large, and carrying out dust rejudgment under the first detection picture by using the defect that is detected in a second detection picture with the dust as dark spots or dark specks. According to the method, the current optical automatic detection algorithm does not need to be fundamentally modified, and only the pre-judging function and the defect re-judgment mechanism of the dust amount coverage degree need to be increased. Meanwhile, the method is simple, effective and more reasonable and optimized, and the accuracy of the detectionresult cannot be influenced. The detection time can be reduced, and the method has the advantages of being easy to realize, saving time and high in practicability.

Description

technical field [0001] The invention relates to the field of image defects, in particular to a method and device for quickly filtering surface dust in panel inspection. Background technique [0002] In the detection of LCD panel defects using AOI, dust filtration on the surface of the panel is a very important part of the detection method, which directly affects the accuracy of defect detection results. During the production process of LCD panels, the surface will inevitably be covered with dust, but the degree of dust coverage on the surface varies greatly. figure 1 For two different dust coverage levels. For the case where the surface of the LCD panel is covered with a small amount of dust, all the dust can be detected and filtered out quickly by the AOI detection method; while for the case where the surface of the LCD panel is covered with a large amount of dust, it takes more TT to detect all the dust. However, in order to ensure the normal operation of the production ...

AI Technical Summary

Problems solved by technology

During the production process of LCD panels, the surface will inevitably be covered with dust, but the degree of dust coverage on the surface varies greatly. figure 1 For two different levels of dust coverage

For the case where the surface of the LCD panel is covered with a small amount of dust, all the dust can be detected and filtered out quickly through the AOI detection method; while for the case where the surface of the LCD panel is covered with a large amount of dust, it takes more TT to detect all the dust

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