A partial pressure mass spectrometer calibration device and method

A technology for a calibration device and a mass spectrometer, which is applied in the field of calibration devices for partial pressure mass spectrometers, can solve the problems of large measurement uncertainty of calibration results and inability to prepare gases according to actual needs, and achieves the effect of reducing measurement uncertainty.

Active Publication Date: 2020-11-27
LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The disadvantages of this system are: (1) only the prepared mixed gas with known components can be used for calibration, and the gas cannot be prepared according to actual needs; The gas state is a viscous flow state, and the gas state changes to a molecular flow state after sample injection, resulting in a change in the composition of the mixed gas after sample injection, requiring complex theoretical calculations to correct the calibration results; (3) The reference standards used are respectively It is an ionization vacuum gauge and a capacitance film vacuum gauge, which leads to a large measurement uncertainty in its calibration results

Method used

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  • A partial pressure mass spectrometer calibration device and method

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Embodiment 1

[0039] A partial pressure mass spectrometer calibration device, mainly composed of a fine-tuning valve 1, a piston pressure gauge 2, a sample preparation chamber 4, multiple high-purity gas cylinders, a capacitance film vacuum gauge 6, a primary sampling chamber 13, and a secondary sampling chamber 21. Sampling chamber, small hole 22, calibration chamber 24, separation gauge 44 and air extraction system; wherein

[0040] The sample preparation chamber 4 is connected with the piston pressure gauge 2 and the capacitance film vacuum gauge 6 respectively, and the sample preparation chamber 4 is also connected with a plurality of high-purity gas cylinders connected in parallel through the fine-tuning valve 1; the sample preparation chamber 4 is connected with the A plurality of sampling chambers with different volumes are connected in parallel between the primary sampling chamber 13, and a plurality of sampling chambers with different volumes are connected in parallel between the pr...

Embodiment 2

[0050] In the present embodiment, there are 3 sampling chambers connected in parallel between the sample preparation chamber 4 and the primary sampling chamber 13, and 3 sampling chambers connected in parallel between the primary sampling chamber 13 and the secondary sampling chamber 21. Specifically:

[0051] A partial pressure mass spectrometer calibration device, mainly composed of trimmer valve 1, piston pressure gauge 2, valves 3, 5, 7, 8, 11, 12, 14, 15, 18, 19, 20, 23, 25, 28, 30 , 31, 32, 34, 35, 36, 38, 39, 40, 42, 43, sample preparation room 4, capacitance film vacuum gauge 6, first sampling room 9, second sampling room 10, first-level sampling room 13 , 4th sampling chamber 16, 5th sampling chamber 17, secondary sampling chamber 21, small hole 22, calibration chamber 24, n high-purity gas cylinders 26, 27, 29, 3rd sampling chamber 33, 6th sampling chamber 37. Separation gauge 44, composed of the first air extraction system, the second air extraction system and the ...

Embodiment 3

[0063] In this embodiment, the gas to be prepared is He and Ar mixed gas with a volume ratio of 1:4.

[0064] Such as figure 1 As shown, the partial pressure mass spectrometer calibration device designed by the present invention consists of trimmer valve 1, piston pressure gauge 2, valves 3, 5, 7, 8, 11, 12, 14, 15, 18, 19, 20, 23, 25, 28, 30, 31, 32, 34, 35, 36, 38, 39, 40, 42, 43, sample preparation room 4, capacitance film vacuum gauge 6, first sampling room 9, second sampling room 10, primary inlet Sample chamber 13, fourth sampling chamber 16, fifth sampling chamber 17, secondary sampling chamber 21, small hole 22, calibration chamber 24, high-purity gas 26, 27, 29, third sampling chamber 33, sixth sampling chamber 37. It is composed of a calibration pressure mass spectrometer 41, a separation gauge 44, and the like.

[0065] In the present embodiment, each part is preferably designed or selected as follows: the measurement accuracy of the piston pressure gauge 2 is 0.0...

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Abstract

The invention provides a partial pressure mass spectrometer calibration device, which mainly consists of a fine-tuning valve, a piston pressure gauge, a sample preparation chamber, a plurality of high-purity gas cylinders, a capacitance film vacuum gauge, a first-stage sampling chamber, a second-stage sampling chamber, a sampling chamber, small hole, calibration chamber, separation gauge and pumping system; the sample preparation chamber is connected to the piston pressure gauge and the capacitive film vacuum gauge respectively, and the sample preparation chamber is also connected to multiple high-purity gas cylinders connected in parallel through fine-tuning valves; Multiple sampling chambers with different volumes are connected in parallel between the sample preparation chamber and the primary sampling chamber, and multiple sampling chambers with different volumes are connected in parallel between the primary sampling chamber and the secondary sampling chamber. The chambers are connected in series with small holes and calibration chambers; the calibration chambers are respectively connected to the partial pressure mass spectrometer to be calibrated and the separation gauge; the sample preparation chamber, the primary sample injection chamber, the secondary sample injection chamber and the calibration chamber are all connected to the pumping system. The invention can not only configure the actually required mixed gas according to the customer's requirement, but also ensure that the gas does not change during the calibration process.

Description

technical field [0001] The invention relates to a partial pressure mass spectrometer calibration device and method, belonging to the technical field of vacuum measurement. Background technique [0002] Partial pressure mass spectrometers are widely used in various fields of industrial production, and the calibration of partial pressure mass spectrometers is an important research direction in the field of vacuum measurement. The document "Robert E.Ellefson.Methods for in situ QMScalibration for partial pressure andomposition analysis.Vacuum, 2014" introduces a partial pressure mass spectrometer calibration device, which combines two calibration methods: (1) direct the known group The mixed gas is introduced into the calibration chamber through a thin tube, and the partial pressure value of each component is obtained through a series of theoretical calculations with an ionization vacuum gauge as a reference standard; (2) First introduce a high-pressure mixed gas of about 100kP...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01L27/00
CPCG01L27/002H01J49/0009H01J49/04
Inventor 李得天孙雯君成永军习振华袁征难赵澜董猛郭美如
Owner LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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