Device and method for evaluating local defect of cable based on impedance spectrum analysis
A technology of local defect and impedance spectrum, which is applied in the direction of measuring device, measuring resistance/reactance/impedance, fault location, etc., can solve the problem of inability to reflect the development trend of local defects, difficulty in detecting the initial state of cables, lack of research devices and technologies, etc. problems, to achieve the effect of simple assembly, strong noise resistance and high application value
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[0076] The present invention will be further described below in conjunction with the accompanying drawings and embodiments.
[0077] A device for evaluating cable local defects based on impedance spectrum analysis, as attached figure 2 As shown, it at least includes a signal generation unit 1 , a signal acquisition unit 2 , an analysis control unit 3 and a data storage unit 4 .
[0078] The signal generation unit 1 is used to generate a sine wave signal of a specified frequency. The sine wave signal is divided into two paths, one of which is used as the incident signal CH0' transmitted to one end of the cable under test, and the other as the reference signal CH0. The incident signal CH0' and The reference signal CH0 has the same amplitude and phase.
[0079] The signal acquisition unit 2 has a first acquisition channel for acquiring a reference signal CH0 and a second acquisition channel for synchronously acquiring a reflected signal CH1, the reflected signal CH1 is a signal...
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