Fabrication method of chip

A manufacturing method and chip technology, applied in the direction of electrical components, circuits, semiconductor devices, etc., can solve the problems of poor growth thickness accuracy of epitaxial layers, large pressing stress growth stress, etc., to overcome the poor growth thickness accuracy, thickness Good accuracy and improved reliability

Active Publication Date: 2018-04-13
YANGZHOU CHANGELIGHT
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Problems solved by technology

[0005] In order to solve the above problems, the technical solution of the present invention provides a method for manufacturing a chip, which does not require substrate transfer, and overcomes the poor accuracy of the growth thickness of the epitaxial layer, the large pressing stress and the growth stress in the prior art problem, improve the reliability of the LED chip

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  • Fabrication method of chip
  • Fabrication method of chip

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Embodiment Construction

[0047] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0048] In the prior art, when manufacturing LED chips, if a non-lattice-matched substrate is used to form the epitaxial layer of the LED chip, the lattice quality of the epitaxial layer will be poor, and the epitaxial stress will be larger and the thickness precision of the epitaxial layer will be lower. Poor, there is a large pressing stress during the substrate transfer process, these problems lead to poor reliability of the LED chip.

[0049] In order to so...

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Abstract

The invention discloses a fabrication method of a chip. A transition substrate in lattice matching of a target epitaxial layer is employed, and a transition epitaxial layer with an integral crystal structure can be formed on a surface of the transition substrate by an epitaxial process; since the transition epitaxial layer is of the integral crystal structure, the target epitaxial layer with a single-crystal structure can be formed on a target substrate which is not in lattice matching by the epitaxial process and by taking the transition epitaxial layer as a target material; since the targetepitaxial layer is of the single-crystal structure formed by the epitaxial process, the thickness accuracy of the target epitaxial layer is relatively good, the growth stress with the target substrateis relatively small, a new substrate is not needed to be laminated so as to perform substrate transferring, the problems of relatively poor growth thickness accuracy and relatively large lamination stress and growth stress of the epitaxial layer in the prior art are solved, and the reliability of an LED chip is improved.

Description

technical field [0001] The invention relates to the technical field of semiconductor technology, and more specifically, to a method for manufacturing a chip. Background technique [0002] The method of industrial production of LED chips is generally to grow the epitaxial layers of LED chips sequentially on sapphire, silicon carbide or silicon substrates to form epitaxial wafers. The epitaxial layer is transferred to a new substrate to improve the optoelectronic performance of the LED chip. The method of transferring the epitaxial layer is to press a new substrate on the epitaxial wafer, and then remove the epitaxial substrate, so as to transfer the epitaxial layer from the epitaxial substrate to the new substrate. [0003] In the prior art, the sapphire substrate is generally removed by a laser lift-off method, the silicon carbide substrate is generally removed by a light-enhanced chemical etching method, and the silicon substrate is generally removed by a chemical etching ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L33/00H01L33/12
CPCH01L33/0066H01L33/12
Inventor 贾钊赵炆兼张双翔杨凯陈凯轩
Owner YANGZHOU CHANGELIGHT
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