Simulation combined relay type stand-alone storage reliability assessment method

A relay and reliability technology, which is applied in the field of storage reliability evaluation of a relay-like stand-alone unit combined with simulation, can solve the problems that a relay-like stand-alone unit cannot provide a large sample size, and it is difficult to ensure the accuracy of the evaluation results. high degree of effect

Inactive Publication Date: 2018-02-23
HARBIN INST OF TECH
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Problems solved by technology

[0004] The present invention aims to solve the problem that certain models of relays cannot provide a large enough sample size in the process of evaluating t

Method used

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  • Simulation combined relay type stand-alone storage reliability assessment method
  • Simulation combined relay type stand-alone storage reliability assessment method
  • Simulation combined relay type stand-alone storage reliability assessment method

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Embodiment Construction

[0032] The present invention will be described in detail below with reference to the accompanying drawings and examples. It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other.

[0033] Such as figure 1 As shown, it is a flow chart of a method for evaluating the reliability of relay class stand-alone storage in combination with simulation in the present invention. The present invention provides a method for evaluating the reliability of relay class stand-alone storage in combination with simulation, which includes the following steps:

[0034] Step S1: According to the schematic diagram of the relay-type stand-alone machine, determine the n relay models that make up the relay-type stand-alone machine;

[0035] Step S2: Carry out the accelerated storage degradation test for the determined n relay models, and monitor and record the degradation data, specifically, carry o...

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Abstract

The invention a simulation combined relay type stand-alone storage reliability assessment method. The method includes steps: determining models of n relays which form a relay type stand-alone according to a schematic diagram; subjecting the relays of different models to accelerated storage degradation testing, and monitoring and recording degradation data; establishing a functional simulation module of the relay type stand-alone; subjecting relay samples to Monte Carlo sampling to obtain m relay sample combinations for construction of m relay type stand-alones; performing relay type stand-alone functional simulation, and acquiring m groups of virtual storage degradation data; adopting a least square method for fitting virtual storage degradation data distribution to determine an optimal distribution type; fitting a storage degradation path of distribution parameters; according to a fitting result of the distribution parameters, calculating reliability of the relay type stand-alone at astorage moment t; according to an adopted acceleration stress type, selecting an acceleration model to perform storage life extrapolation. By adoption of the method, relay type stand-alone storage reliability indexes can be directly estimated in a design state.

Description

technical field [0001] The invention relates to the technical field of performance analysis of single-unit relay products, in particular to a storage reliability evaluation method for single-unit relays combined with simulation. Background technique [0002] As another state corresponding to work, storage is an important part of the product mission profile and occupies a large proportion in the life cycle of most products, especially for one-time use products such as missiles, space shuttles, Launch vehicles, etc., are in storage for most of the time before launch. Therefore, the combined effect of various environmental stresses during storage is the key to the degradation of its performance. With the deepening of research in the field of reliability, the related research on storage reliability has received more and more attention. Compared with the work reliability research, the relatively long storage period of the product has led to the problems of long test time and sm...

Claims

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Application Information

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IPC IPC(8): G06F17/50
CPCG06F30/20
Inventor 叶雪荣谭俊吴岳林义刚翟国富
Owner HARBIN INST OF TECH
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