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Bayesian theory-based relay-class single-machine storage reliability assessment method

A Bayesian theory and relay technology, applied in the fields of instrumentation, electrical digital data processing, special data processing applications, etc., can solve problems such as gaps in the evaluation results of batch product storage reliability, insufficient test sample size, etc., to improve utilization efficiency , the effect of improving the accuracy

Inactive Publication Date: 2018-02-16
HARBIN INST OF TECH
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Problems solved by technology

[0004] In the process of evaluating the storage reliability of single-unit relays, it is usually necessary to face the problem of insufficient test samples, which leads to a large gap between the evaluation results of storage reliability of batch products and the actual situation

Method used

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  • Bayesian theory-based relay-class single-machine storage reliability assessment method
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  • Bayesian theory-based relay-class single-machine storage reliability assessment method

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Embodiment Construction

[0029] The present invention will be described in detail below with reference to the accompanying drawings and examples. It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other.

[0030] Such as figure 1 As shown, it is a flow chart of a method for evaluating the storage reliability of a relay class stand-alone machine based on Bayesian theory in the present invention. The present invention provides a kind of relay class stand-alone storage reliability assessment method based on Bayesian theory, and it comprises the following steps:

[0031] Step S1: Obtain relevant data that can be used to improve the accuracy of the evaluation results of the reliability of the relay-type single-unit storage, as prior information for storage reliability assessment, specifically to obtain relevant data that can be used to improve the accuracy of the evaluation results of the storage rel...

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Abstract

The invention discloses a Bayesian theory-based relay-class single-machine storage reliability assessment method. The method comprises the following steps of: obtaining related data which can be usedfor improving the correctness of relay-class single-machine storage reliability assessment results; carrying out a relay-class single-machine storage degeneration experiment and obtaining storage degeneration data; converting storage reliability prior information into a prior estimate of a hyper-parameter of a relay-class single-machine output characteristic distribution parameter; obtaining a posterior estimate of the hyper-parameter; calculating an expected value of the relay-class single-machine output characteristic distribution parameter according to the posterior estimate of the hyper-parameter; carrying out function fitting on the expected value of the distribution parameter about a storage time t; and calculating relay-class single-machine storage reliability according to the fitting result of the expected value of the distribution parameter. According to the method, the Bayesian theory and practical experiment data are combined, and effective utilization of the information isrealized, so that the aim of improving the storage reliability assessment correctness is achieved.

Description

technical field [0001] The invention relates to the technical field of performance analysis of single-unit relay products, in particular to a storage reliability evaluation method for single-unit relays based on Bayesian theory. Background technique [0002] In the relevant research in the field of storage reliability, due to the difference in type and magnitude between the environmental stress in the storage process and the stress in the working process, the degree of acceleration of the product degradation process is also different. Generally speaking, under the action of storage stress, the degradation rate of the product is relatively slow. Therefore, more test samples, longer test time and higher precision test equipment are usually required when carrying out storage reliability tests. However, limited by actual conditions, the number of test samples and test time that can be used to carry out storage reliability tests are usually not sufficient, and it is difficult to...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50
CPCG06F30/20G06F2111/10
Inventor 叶雪荣林义刚牛皓翟国富
Owner HARBIN INST OF TECH
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