Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Examination performance statistical analysis system

A technique of statistical analysis and performance, applied in the field of statistical analysis, can solve problems such as no objective and specific analysis and evaluation, and achieve the effect of shortening time and reducing workload

Inactive Publication Date: 2018-01-19
麦峰数据科技(苏州)有限公司
View PDF2 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For the analysis of each student's individual test scores, there is currently no objective and specific analysis and evaluation, only relying on the perceptual judgments made by teachers and students

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Examination performance statistical analysis system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. The components of the embodiments of the invention generally described and illustrated in the figures herein may be arranged and designed in a variety of different configurations. Accordingly, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely represents selected embodiments of the invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without cre...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an examination performance statistical analysis system comprising a login module, an examination performance input module, an examination performance modification module, a anexamination performance storage module, a data processing module and an examination performance display module, wherein the login module is used by teachers, students and parents for login; the examination performance input module is used for inputting total examination performance and inputting scores of questions of examination paper; the examination performance modification module is used fordirectly performing visible modification on a page if an input error is discovered after the examination performance is input; the examination performance storage module is used for storing the inputexamination performance in a database for storing data; the data processing module is used for processing the data stored in the database, so that the data can be directly used, and the complex querytime can be shortened; and the examination performance display module is used for displaying the analyzed and processed examination performance. The examination performance statistical analysis systemprovided by the invention has the characteristics of simple operation and high efficiency.

Description

technical field [0001] The invention relates to the technical field of statistical analysis, in particular to an examination result statistical analysis system. Background technique [0002] In the conventional school teaching process, the test scores after the test are generally recorded by the teacher directly on paper or in an excel form according to the test paper, and then written into the report card and given to the students. This recording method is not only inconvenient to query, but also cannot form systematic analysis and tracking. Every time a student’s grade needs to be analyzed, a large number of historical data tables need to be dug out to record and analyze one by one. The efficiency of data analysis is very low and accurate. The rate is not high. [0003] At present, the statistical analysis of test scores is still done manually, which causes a huge workload for teachers. The analysis of the test questions for each test, whether the answers to the test que...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06Q50/20G06Q10/06G06F17/30
Inventor 张云峰李佳宇
Owner 麦峰数据科技(苏州)有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com