Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Liquid crystal display device production line test result storage method

A liquid crystal display and test result technology, applied to static indicators, instruments, etc., can solve the problems of high cost of code reading equipment, easy to read wrong barcodes, and lower error code rate, so as to shorten the burning time, improve efficiency, and improve efficiency effect

Inactive Publication Date: 2017-12-19
L&T DISPLAY TECH FUJIAN
View PDF5 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Manual code reading will take up manpower, it is easy to read the wrong barcode, the reading time is about 3 seconds, and the efficiency is low
Using a high-precision code reading gun, the code error rate is reduced, but the cost of code reading equipment is high and the efficiency is also low

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Liquid crystal display device production line test result storage method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] Such as figure 1 Shown, a kind of liquid crystal display production line test result preservation method of the present invention, it comprises the following steps:

[0020] 1) When the burning program burns the extended display identification data (EDID), it sends the original serial number (SN) data to the LCD and saves it in the firmware of the LCD; specifically, at the station where the EDID is burned , you can use a code reading gun to read the code, and all or part of the serial number data is saved in the EDID, which meets the premise of the test program to read the original serial number data.

[0021] 2) calling the test program to test the liquid crystal display, the test program directly reads the original serial number data from the firmware of the liquid crystal display before the test, and generates the target serial number data based on the original serial number data;

[0022] 3) When the acquisition of the target serial number data fails, the test prog...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a liquid crystal display device production line test result storage method. The method comprises the steps that: (1) when a burning program burns extended display identification data, original serial number data is sent to a liquid crystal display device and is stored into a firmware of the liquid crystal display device, (2) a test program is called to test the liquid crystal display device, the test program directly reads the original serial number data from the firmware of the liquid crystal display device before a test and generates target serial number data based on the original serial number data, (3) when the acquisition of the target serial number data is failed, the test program display an acquisition error and prompts an operator to carry out exception handling, (4) when the acquisition of the target serial number data is successful, the test program carries out test according to a selected test item, (5) the test program stores a test result and corresponding target serial number data into a local or network database after the test item is completed, and (6) the test program prompts a corresponding liquid crystal display device that the test is completed and notifies the operator to test a next liquid crystal display device. The method has the advantages of short testing and burning times, no need of manual reading of a code, the effective reduction of manpower, the improvement of efficiency and the reduction of production cost.

Description

technical field [0001] The invention relates to the technical field of liquid crystal production, in particular to a method for storing test results of a liquid crystal display production line. Background technique [0002] In the production of LCD monitors, in order to facilitate abnormal analysis, it is necessary to save the adjustment results and unique serial numbers of each monitor. Generally, ordinary code reading guns are used, and the barcodes required for manual alignment are read into the adjustment program. Manual code reading will take up manpower, and it is easy to read the wrong barcode. The reading time is about 3 seconds, and the efficiency is low. Using a high-precision code reading gun reduces the code error rate, but the cost of code reading equipment is high and the efficiency is also low. Contents of the invention [0003] The purpose of the present invention is to overcome the deficiencies of the prior art and provide a method for storing test resul...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G09G3/00
CPCG09G3/006
Inventor 卢业敏李国栋张垂宏
Owner L&T DISPLAY TECH FUJIAN
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com