Heat-shrinkable film defect detection method and terminal equipment
A defect detection and heat-shrinkable film technology, which is applied in optical testing flaws/defects, measuring devices, material analysis by optical means, etc. Detection accuracy and detection reliability, the effect of improving detection efficiency and production efficiency
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[0031] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present invention. It will be apparent, however, to one skilled in the art that the invention may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present invention with unnecessary detail.
[0032] In order to illustrate the technical solutions of the present invention, specific examples are used below to illustrate.
[0033] figure 1 The implementation flowchart of the heat shrinkable film defect detection method provided by the embodiment of the present invention is described in detail as follows:
[0034] In S101, an initial image including a heat-shrinkable film is acquired.
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