Apparatus for highly-efficiently reconstructing three-dimensional microstructure morphology of material, and reconstruction method thereof

A tissue morphology and three-dimensional technology, applied in measuring devices, analyzing materials, material analysis through optical means, etc., can solve the problems of time-consuming, labor-intensive efficiency, etc., achieve the effect of reducing the consumption of manpower and material resources, and having a wide range of applications

Active Publication Date: 2017-11-03
XIAN TECHNOLOGICAL UNIV
View PDF3 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The present invention provides a device and a reconstruction method for efficiently reconstructing the three-dimensional structure of materials, so as to overcome the time-consuming, labor-intensive and low-efficiency problems in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Apparatus for highly-efficiently reconstructing three-dimensional microstructure morphology of material, and reconstruction method thereof
  • Apparatus for highly-efficiently reconstructing three-dimensional microstructure morphology of material, and reconstruction method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0031] Example 1: A reconstruction method for efficiently reconstructing the three-dimensional structure of a material. In this example, the sample used is an aluminum alloy material. The specific operations are as follows:

[0032] 1. Process the sample according to the shape of the cylindrical sample fixture, and form a clearance fit with the fixture. The height of the sample is higher than the height of the fixture. The sample can move up and down in the cylindrical fixture, but cannot move horizontally;

[0033] 2. The first metallographic photo is manually polished, and then the polished sample and the counterweight are bonded or fixed with screws, and the sample is put into a cylindrical fixture. Under the action, the lower end of the sample falls freely on the surface of the polishing disc;

[0034] 3. After polishing on the polishing disc for a fixed time, remove the polishing disc, and use the sample transfer system to move the sample down to the inverted metallograph...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention belongs to the technical field of material characterization, and especially relates to an apparatus for highly-efficiently reconstructing the three-dimensional microstructure morphology of a material, and a reconstruction method thereof. The problem of time and labor consuming and low efficiency existing in the prior art are solved in the invention. The apparatus comprises a metallographic microscope, a camera, a sample clamping assembly and a polishing assembly, the metallographic microscope is inverted, the camera is an autofocus camera, the sample clamping assembly comprises a supporting rod capable of rotating in a horizontal direction and a clamp movably arranged at the end portion of the supporting rod, and the polishing assembly comprises a supporting rack capable of rotating in the horizontal direction and a polishing disc horizontally arranged on the supporting rack; and the clamp opens up and down, the cross section of the clamp has a noncircular shape, a sample with a noncircular cross section is clamped in the clamp, a balancing weight is arranged on the upper end surface of the sample, at least one radial dimension of the cross section of the clamp is smaller than the radial dimension of the cross section of the balancing weight, and the lower end surface of the sample and the disc surface of the polishing disc are located in the same horizontal plane.

Description

technical field [0001] The invention belongs to the technical field of material characterization, and in particular relates to a device and a reconstruction method for efficiently reconstructing a three-dimensional structure of a material. Background technique [0002] The microstructure of materials determines the properties of materials, and the observation and characterization of material morphology is an important part of microstructure characterization and one of the important means to evaluate material properties. For a long time, metallography, scanning electron microscopy, and even transmission electron microscopy and atomic force microscopy have all observed and analyzed the structure and morphology of materials from the two-dimensional level. However, some information about the microstructure cannot be observed by two-dimensional characterization, such as the three-dimensional connectivity of graphite in cast iron, and the spatial network characteristics of solidif...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/32G01N21/84
CPCG01N1/32G01N21/84
Inventor 马志军郭永春高培虎
Owner XIAN TECHNOLOGICAL UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap