Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Integrated test device for simulating DC system integrated type grounding fault

A ground fault and DC system technology, applied in the field of measurement, can solve problems such as hidden accidents, secondary system accidents, and potential threats to the system, achieving fast and efficient processes and a wide range of research

Pending Publication Date: 2017-09-19
HONGHE POWER SUPPLY BUREAU OF YUNNAN POWER GRID
View PDF12 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The system operates under different working conditions, and the consequences of various types of failures are not the same. When it is mild, it may only pose a potential threat and accident hazard to the system, and when it is serious, it will cause a major accident to the secondary system of the entire plant.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Integrated test device for simulating DC system integrated type grounding fault
  • Integrated test device for simulating DC system integrated type grounding fault
  • Integrated test device for simulating DC system integrated type grounding fault

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0017] The following are specific embodiments of the invention and in conjunction with the accompanying drawings, the technical solutions of the present invention are further described, but the present invention is not limited to these embodiments.

[0018] Such as Figure 1-3 As shown, the integrated test device for simulating comprehensive ground faults in DC systems includes a test controller 1 and a comprehensive fault simulator 2, and the test controller 1 is connected to the comprehensive fault simulator 2.

[0019] Wherein, the test controller 1 includes a first housing 3, a control circuit board 24 is arranged in the first housing 3, and a liquid crystal display 4, a setting panel 5, an operating button 6, a master switch are arranged on the surface of the first housing 3 7. The control circuit board 24 is connected with the liquid crystal display 4, the setting panel 5, the operation button 6, and the main switch 7 respectively. A fault trigger button 21 is provided ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the technical field of measurement and particularly relates to an integrated test device for simulating a DC system integrated type grounding fault. The device comprises a test control instrument and an integrated fault simulation generator. The test control instrument is connected to the integrated fault simulation generator and comprises a first shell which is internally provided with a control circuit board. The surface of the first shell is provided with a liquid crystal display screen, a setting panel, an operation button and a master switch. The control circuit board is connected to the liquid crystal display screen, the setting panel, the operation button and the master switch. The integrated fault simulation generator comprises a second shell which is provided with a pointer type voltage meter, a pointer type ammeter and a DC output device, the DC output device is connected to the pointer type voltage meter and the pointer type ammeter through a I section branch, and the DC output device is connected to the pointer type voltage meter and the pointer type ammeter through a II section branch. The integrated test device has the advantages of a wide research range of a test and a quick and efficient process.

Description

technical field [0001] The invention belongs to the technical field of measurement, and in particular relates to an integrated test device for simulating a comprehensive type grounding fault of a DC system. Background technique [0002] As the power supply source of the secondary system control, protection, signal and automatic devices in the plant, the DC system’s own reliability and safety have a very important impact on the stable operation of the power supply, and the ground fault of the DC system has always been the It is an extremely weak link in the power system. At the same time, there are many devices connected to the DC system and the circuit structure is complex. Various types of faults will occur according to the grounding conditions. The more common ground faults in the DC system include single-point grounding, two-point grounding and multi-point grounding. The fault points include load branch grounding, system grounding and other types. The system operates und...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R31/02
CPCG01R31/50
Inventor 李璟瑞高甲徐显光徐芸罗凯屈万龙苏嘉力施红军李诚李世伟马晓光许航达
Owner HONGHE POWER SUPPLY BUREAU OF YUNNAN POWER GRID
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com