Test device and test method for current-carrying characteristic of high-temperature superconducting stripe

Abstract

The invention relates to a test device and test method for a current-carrying characteristic of a high-temperature superconducting stripe. The test device is characterized in that two opposite semicircular guide grooves are formed in the top of a liquid nitrogen Dewar unit; and copper threaded rods are inserted into the guide grooves and are suspended in the liquid nitrogen Dewar unit by nuts. The top ends of the threaded rods are connected with a direct-current source; and the threaded rods are sleeve at a circular-ring-shaped guide rail movably by guide holes. The end portions of a high-temperature superconducting stripe are welded to the lower ends of the threaded rods. A lead of a nanovoltmeter is welded to a non-end portion part of the high-temperature superconducting stripe. A lifting screw rod is inserted into a lifting hole in the center of the top of the liquid nitrogen Dewar unit and is suspended in the liquid nitrogen Dewar unit by a lifting cap; and the bottom of the lifting screw rod is fixedly connected with the top of an inverted-U-shaped electromagnet; and the bottom of the electromagnet is fixedly connected with the guide rail. Two multi-stage-stepped semi-circular truncated cones are fixed at the bottom of the liquid nitrogen Dewar unit and the arc surfaces of the two semi-circular truncated cones are opposite. Therefore, the critical current change of the high-temperature superconducting stripe at different magnetic fields under different bending radiuses can be measured.

Description

technical field [0001] The invention relates to a test device and a test method for the current-carrying characteristics of a high-temperature superconducting strip. Background technique [0002] With the continuous improvement of the performance of high-temperature superconducting tapes, high-temperature superconducting tapes have begun to operate in various superconducting devices such as superconducting cables, superconducting energy storage devices, superconducting transformers, and superconducting current limiters. The superconducting strips used in these superconducting devices are often in a bent state, and with different bending radii, different bending strains will be generated, which will cause a large impact on the current-carrying capacity (critical current) of the high-temperature superconducting strips. influences. For the Y-series high-temperature superconducting tape, it is a coated conductor, and the superconducting layer is not at the central symmetrical p...

AI Technical Summary

Problems solved by technology

When the high-temperature superconducting strip is taken out and re-bent, the temperature rises rapidly, and then it is put into the low-temperature Dewar to cool down rapidly. The sudden change of temperature will form a residual temperature strain in the high-temperature superconducting strip that affects the current-carrying capacity, and will also lead to test results. Inaccurate, big error

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