Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Flat panel detector for X-ray phase-contrast imaging and use method of flat panel detector

A flat-panel detector and phase contrast imaging technology, applied in the field of X-ray detectors, can solve the problems of increasing the accuracy and the requirements of the experimental environment, etc.

Pending Publication Date: 2017-09-08
LANZHOU UNIVERSITY
View PDF11 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] To sum up, the problems existing in the existing technology are: the existing flat-panel detectors cannot be directly used for CBI phase-contrast imaging, and an additional detector coding hole plate A2 is needed, and a precision motion platform is needed to code the detectors Orifice plate A2 performs positioning and position correction, which increases the requirements for accuracy and experimental environment

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Flat panel detector for X-ray phase-contrast imaging and use method of flat panel detector
  • Flat panel detector for X-ray phase-contrast imaging and use method of flat panel detector
  • Flat panel detector for X-ray phase-contrast imaging and use method of flat panel detector

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] The implementation of the present invention will be described in detail below with examples, so as to fully understand and implement the implementation process of how the present invention uses technical means to solve technical problems and achieve technical effects.

[0028] The invention discloses a flat panel detector for X-ray phase contrast imaging, such as figure 2 As shown, the improved FPD includes a protective layer 201, an encoding hole plate A3 202, a scintillator layer 203 and a detector pixel layer 204; the specific implementation is to grow the scintillator layer 203 on the detector pixel layer 204, and then grow the scintillator layer 203 on the scintillator layer 203 It is covered with a coded aperture plate A3202 that is consistent with the period of the detection pixels to block the edge of each pixel, and finally covered with a protective layer 201, which constitutes the basic structure of the improved FPD, which can be directly used for CBI phase co...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a flat panel detector for X-ray phase-contrast imaging and a use method of the flat panel detector. The flat panel detector for the X-ray phase-contrast imaging comprises a detector pixel layer, wherein a scintillator layer grows or is attached to the detector pixel layer; the scintillator layer is covered with a coded mask consistent with a detection pixel period; the coded mask is covered with a protecting layer. The flat panel detector for the X-ray phase-contrast imaging, disclosed by the invention, can be used for CBI phase-contrast imaging, and also can be used for effectively inhibiting scattering and reducing photon interference between every two adjacent pixels in conventional X-ray absorption-contrast imaging application, so that the image resolution is improved.

Description

technical field [0001] The invention belongs to the field of X-ray detectors, and in particular relates to a flat panel detector for X-ray phase-contrast imaging and a using method thereof. Background technique [0002] X-ray phase-contrast imaging (XPCI) is a new type of X-ray imaging technology that restores object information based on the mechanism of phase change after rays pass through the object. Objects can give higher contrast than traditional X-ray absorption contrast imaging, so they have great application prospects in the fields of clinical medicine, life science, material science and industry. Coded-aperture based imaging (CBI) is a phase-contrast imaging method that is expected to push XPCI technology to practical applications. Its biggest feature is that it is an incoherent method. Compared with other classical phase contrast imaging methods, such as Propagation based imaging (PBI), Analyzer based imaging (ABI) and grating interferometry (Grating interferometr...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/04G01T1/202
CPCG01N23/04G01T1/202
Inventor 潘小东张催李公平
Owner LANZHOU UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products