Insertion Loss and Phase Error Correction Device of Selected Path for Multi-module Teaching Experiment

Abstract

The invention discloses an insertion loss and phase error correction device for a multi-module teaching experiment selection path. The error correction device designs a reference path on the basis of the existing multi-module teaching experiment selection path. The reference path is controlled by an experiment input interface. , the n+1th selection switch of the input-end experimental module selection circuit, the dedicated path correction circuit, the n+1th selection switch of the output-end experimental module selection circuit, and the experimental output interface are connected in sequence through signal lines, and the dedicated path correction circuit It is used to simulate the amplitude and phase characteristics of the dedicated channel of the input terminal and the dedicated channel of the output terminal. By designing the above-mentioned reference path, the present invention uses the insertion loss and phase error of the reference path as a reference to calibrate the test equipment during the experiment, eliminating the insertion loss and phase error introduced by the experimental selection path in the test results of the multi-module teaching experiment, so that the test The result can truly reflect the characteristics of the unit circuit.

Description

technical field [0001] The invention belongs to the field of teaching experiment devices, and in particular relates to an insertion loss and phase error correction device for a multi-module teaching experiment selection path. Background technique [0002] In the teaching activities of electronics and information engineering majors such as microwave engineering and communication engineering courses in colleges and universities, it is necessary to extract and test the unit module circuits in the signal chain to help students deepen their understanding of related knowledge and recognize related unit modules. Circuits, master the engineering application of related unit module circuits, so as to improve students' practical operation ability and engineering application ability. The composition of the multi-module teaching experiment selection pathway in the prior art scheme is as follows: figure 1 Shown: [0003] The experimental selection pathway is composed of a shared pathway...

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Problems solved by technology

[0004] Switch the unit module circuit to the experimental input and output interface, and directly carry out the unit module circuit test experiment through the experimental test equipment. The above-mentioned experimental selection path mainly has the following disadvantages: 1. Extract various unit circuits in the signal chain and switch to Experimental input and output interfaces will introduce insertion loss and phase error; 2. Insertion loss has a frequency response; 3. The introduction of insertion loss and phase error has not been corrected, resulting in experimental test results that cannot correctly reflect the characteristics of the unit module circuit

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