Micro thrust measuring method and devices
A measurement method and micro-thrust technology, applied in measuring devices, force/torque/power measuring instruments, instruments, etc., can solve the problems of sensitive mass changes, large errors, and low precision, and achieve the effect of high sensitivity and simple structure
Inactive Publication Date: 2017-08-25
HENAN POLYTECHNIC UNIV
View PDF4 Cites 22 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
[0004] The present invention provides a method and device for measuring micro-thrust to solve the problems in the prior art mentioned in the above-mentioned background art, such as the fact that the thrust and gravity are in the same direction or are sensitive to the mass change of the thruster, etc., resulting in low accuracy and big error problem
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment
[0046] This embodiment: as figure 1 As shown, a micro-thrust measurement method includes converting the micro-thrust physical quantity into a displacement physical quantity S2 through the principle of mechanical balance while maintaining the vertical state S1 of the gravity direction and the micro-thrust direction.
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More
Abstract
The invention belongs to the technical field of micro thrust measurement, and especially relates to a micro thrust measuring method. The invention further provides a pendulum micro thrust measuring device and a three-wire torsion pendulum micro thrust measuring device. Under the condition that the gravity direction and the micro thrust direction are perpendicular to each other, a micro thrust physical variable is converted into a displacement physical variable based on the principle of mechanical equilibrium. The problem in the prior art that measurement is of low precision and large error due to the fact that the thrust and the gravity are in the same direction, the sensitivity to the mass change of a thruster or other factors is solved. The method and the devices have the beneficial technical effects of no influence of gravity, small friction, and good damping effect.
Description
technical field [0001] The invention belongs to the technical field of micro-thrust measurement, and in particular relates to a micro-thrust measurement method. At the same time, the invention also provides a single pendulum micro-thrust measurement device and a three-wire torsional pendulum micro-thrust measurement device. Background technique [0002] Micro-thrust measurement technology refers to the measurement of thrust between a few micronewtons and several Newtons. This technology is a main content of the electric thruster thrust test. The micro-thrust test has several characteristics: 1. High sensitivity, thruster The thrust produced is between a few micronewtons and a few Newtons, and for such a small thrust, many factors that are usually negligible are enough to drown it out, for example, the sound of human footsteps or general experimental operations etc. may have a great impact on the test results. Second, the thrust-to-weight ratio is very small. Compared with th...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More
IPC IPC(8): G01L5/00
CPCG01L5/00
Inventor 石峰王昊李强徐永豪刘小莲王国东
Owner HENAN POLYTECHNIC UNIV
Who we serve
- R&D Engineer
- R&D Manager
- IP Professional
Why Patsnap Eureka
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com