Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Multi-color stimulated radiation exhaustion super-resolution imaging device and method thereof, and optical microscope

A stimulated radiation depletion, super-resolution imaging technology, applied in microscopes, optics, measurement devices, etc., can solve the problems of multiple channel cross-interference, lateral deviation of multiple imaging channels, cross color, etc., to improve imaging resolution, The effect of avoiding the horizontal deviation of the image and saving the economic cost

Active Publication Date: 2017-08-04
INNOVATIVE SEMICON SUBSTRATE TECH CO LTD
View PDF5 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, no matter which method is used to achieve multi-color STED imaging, it will face the problem of cross-interference (cross-color) between multiple channels, and the first method will also have the problem of lateral deviation between multiple imaging channels.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multi-color stimulated radiation exhaustion super-resolution imaging device and method thereof, and optical microscope
  • Multi-color stimulated radiation exhaustion super-resolution imaging device and method thereof, and optical microscope
  • Multi-color stimulated radiation exhaustion super-resolution imaging device and method thereof, and optical microscope

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0046] According to the basic idea of ​​the present invention, a device for realizing simultaneous multicolor super-resolution imaging is provided. In this imaging device, multicolor confocal microscopic imaging is firstly realized, and STED loss light is added to each color channel to realize super-resolution optical imaging. In the imaging device, the shutters are used to switch the excitation and detection of different channels respectively to realize line scan mode imaging and successfully solve the problem of cross-interference between multiple channels.

[0047] An embodiment of the present invention provides a device for simultaneous multi-color super-resolution imaging, including a plurality of excitation light sources, which respectively output excitation lights with different excitation spectra from each other; a loss light source, which outputs stimulated radiation depletion light; an optical system for Irradiating the adjusted excitation light and stimulated radiat...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A multi-color stimulated radiation exhaustion super-resolution imaging device comprises a plurality of excitation light sources, a loss light source, a photoelectric detector, a control unit and an optical system. The optical system comprises a plurality of shutters which are located on exciting light optical path output by each excitation light source respectively. The control unit makes that the plurality of shutters open by turns so that excitation light output by each excitation light source successively irradiates an imaging area. On the device, multiple paths of excitation light carries out sample excitation and a same path of STED loss light is used to carry out fluorescence quenching so that STED simultaneous multicolor super-resolution imaging is realized and a condition that image deviation is generated among channels is avoided. Besides, in the imaging device, the shutters are used to open and close excitation and detection of the different channels respectively, line scanning mode imaging is realized and a cross interference problem among the plurality of channels is solved.

Description

technical field [0001] The invention relates to the field of microscopic imaging, further relates to a multicolor super-resolution imaging device and a multicolor stimulated radiation depletion super-resolution imaging method, and further relates to an optical microscope based on scanning imaging. Background technique [0002] Since the optical microscope can perform real-time dynamic imaging observation of biological samples under physiological conditions, it has become an indispensable research tool for biologists, and the development of optical microscopes is also accompanied by the progress of life sciences. However, due to the existence of the optical diffraction limit, the spatial resolution of optical microscopy is limited to about half a wavelength, which seriously hinders biologists from conducting finer research at the subcellular scale. Since Stefan W. Hell theoretically proposed to break through the diffraction limit in 1994, after more than 20 years of developme...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G02B21/00G02B21/16G01N21/64
CPCG01N21/6428G01N21/6458G02B21/0032G02B21/0076G02B21/16
Inventor 阮贺飞袁景和于建强方晓红
Owner INNOVATIVE SEMICON SUBSTRATE TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products