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Harmonic source judgment method based on harmonic phase jitter characteristic

A phase jitter and harmonic source technology, which is applied in the field of harmonic source judgment based on the characteristics of harmonic phase jitter, can solve the problems of large amount of calculation and complicated methods, and achieve the effect of large amount of calculation, simple operation and novel ideas

Active Publication Date: 2017-06-20
BEIHANG UNIV
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Problems solved by technology

[0004] The technical problem of the present invention is to overcome the complicated method and large amount of calculation in the prior art, and provide a harmonic source judgment method based on the characteristics of harmonic phase jitter, the principle is easy to understand, and the operation and data processing are simple

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  • Harmonic source judgment method based on harmonic phase jitter characteristic
  • Harmonic source judgment method based on harmonic phase jitter characteristic
  • Harmonic source judgment method based on harmonic phase jitter characteristic

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Embodiment Construction

[0053] The present invention will be further described in detail with reference to the accompanying drawings and embodiments.

[0054] Such as figure 1 As shown, the present invention proposes a harmonic source judgment method based on the harmonic phase jitter characteristics, including the following processing steps:

[0055] Step 1, signal acquisition, when t=0, use data acquisition card to carry out the first collection to the output port of the device under test of single-port output, obtain the device under test output signal, the output signal of collecting for the first time uses formula (16 )express,

[0056]

[0057] Step 2, data processing, perform Fourier transform on the output signal of the device under test obtained in step 1 to obtain signal data in complex form, according to the definition of phase Im is the imaginary part of the Fourier transform, Re is the real part of the Fourier transform, is the signal phase, calculate the frequency-phase relation...

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Abstract

The invention relates to a harmonic source judgment method based on the harmonic phase jitter characteristic. The first time of acquisition is performed on the output port of equipment to be tested of single port output so that the output signal of the equipment to be tested is obtained; Fourier transform is performed on the obtained output signal of the equipment to be tested; the second time of sampling and data processing are performed: the second time of acquisition is performed on the output port of the equipment to be tested by using a data acquisition card so that the output signal of the equipment to be tested is obtained, Fourier transform is performed on the output signal of the equipment to be tested of the second time of acquisition, and the signal phase is calculated according to the phase definition; and unwrapping is performed on the phase of which the harmonic component is briefly called frequency doubling, and when the ratio of the phase difference values of the frequency doubling signals in two phase-frequency diagrams is equal to the ratio of the harmonic number of times and the ratio of the phase change rate of the sampling interval of the frequency doubling signals is equal to the ratio of the harmonic number of times, the frequency components in the diploid relation have the consistent jitter characteristic so that the frequency doubling signals are judged to be from the same harmonic source, or the frequency doubling signals are from different independent sources.

Description

technical field [0001] The invention belongs to the field of electromagnetic compatibility testing, and relates to a harmonic source judging method based on the harmonic phase shake characteristics. Background technique [0002] In the electromagnetic compatibility conducted interference emission test, there are many independent interference sources inside the device under test. The interference signals generated by these interference sources are coupled to the port under test through the coupling channel, and together form the interference signal of the port under test. When the signal emission at a certain frequency point in the port output of the device under test exceeds the standard, it is necessary to locate and rectify the emission source corresponding to the frequency. However, there is a situation that when the internal interference source of the device under test transmits signals at the port to be tested with several frequencies of multiplied frequencies, it is ne...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R23/16
CPCG01R23/16
Inventor 戴飞王凯高占威
Owner BEIHANG UNIV
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