Mirror-like surface 3D shape measuring method based on Kinect and fringe reflection
A technology of three-dimensional surface shape and fringe reflection, which is applied in the direction of measuring devices, instruments, and optical devices, etc., can solve the problems of low measurement accuracy, difficulty in realizing color-like mirror surface measurement in three-dimensional shape measurement, and difficult to meet the measurement requirements, etc. Achieve the effects of simplifying calculations, improving reconstruction speed, and reducing the number of iterations
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0032] Embodiments of the present invention will be further described in detail below with reference to the accompanying drawings.
[0033]The present invention is achieved in this way, the composite three-dimensional surface shape measurement method combining Kinect and fringe reflection method is characterized in that it is composed of two key parts: three-dimensional point cloud data acquisition based on Kinect and three-dimensional measurement of fringe reflection.
[0034] One based on kinect point cloud data acquisition;
[0035] Point cloud data acquisition mainly includes two parts: depth information acquisition and point cloud data registration. Depth data is the heart and soul of Kinect. The transformation from a 2D depth image to a 3D space point cloud is a transformation between two coordinate systems. At the same time, the depth information acquisition principle of the device is also closely related to the coordinate system transformation. RGB-D information prov...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com