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E-exponential type nonlinear nano-metal taper probe

A nano-metal, nonlinear technology, applied in the field of optics and optoelectronics, to achieve the effect of improving sensitivity

Inactive Publication Date: 2017-06-13
NANKAI UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the logarithmic nonlinear structure that has been proposed so far can only achieve a limited degree (4 orders of magnitude) for the enhancement effect of the nano-focusing field.

Method used

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  • E-exponential type nonlinear nano-metal taper probe
  • E-exponential type nonlinear nano-metal taper probe
  • E-exponential type nonlinear nano-metal taper probe

Examples

Experimental program
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Embodiment 1

[0022] Such as figure 1 As shown, an e-index nano-metal nonlinear tapered probe with high spatial resolution, high sensitivity, and strong longitudinal polarization electric field can be generated. The probe is composed of an e-index metal nano-non-linear tapered structure. The structural equation h(ρ,θ) of the needle in the cylindrical coordinate system is:

[0023]

[0024] Among them: ρ and θ are the radius and angle in the cylindrical coordinate system, h 0 is the preset height parameter, r 0 is the preset base radius, h 0 and r 0 size on the nanometer scale. a is e exponential nonlinear factor, and 0.04≤a≤0.055, (the variation range of a is 0.005), Δh is the height modulation factor, and 4≤Δh≤12, Δh is an integer.

[0025] The fabrication of e-exponential nonlinear metal cone probe in the present invention can be realized by electrochemical method. The specific steps are as follows:

[0026] (1) Use ferric chloride solution with a mass fraction of 40% as the ele...

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Abstract

Provided is an e-exponential type nonlinear nano-metal taper probe high in spatial resolution, high in sensitivity and capable of producing a strong longitudinal polarizing electric field and adjusting the intensity of the electric field. The probe is composed of an e-exponential type nonlinear nano-metal taper structure. When incident light (especially radially polarized light) is irradiated to the bottom surface of the e-exponential type nonlinear nano-metal taper probe, surface plasmons are excited from the metal surface and are propagated along the curved surface of a nonlinear nano-metal taper and compressed to the top end to form highly and locally reinforced electromagnetic field distribution, and accordingly strong nano focusing is obtained. The probe can be used for scanning near-field microscopes, atomic force microscopes and other scanning probe microscopes and needle-enhanced Raman spectrometers and has the important application value in the multiple fields such as single-molecule imaging, heat-assisted magnetic recording, nano sensing, nano imaging, nano photoetching and nano control.

Description

technical field [0001] The invention belongs to the field of optics and photoelectric technology, and relates to nano-optoelectronic devices, surface plasmon excitation, nano-focusing and vector field, and is a high-spatial-resolution, high-sensitivity, capable of generating strong longitudinally polarized electric fields, and can adjust the electric field intensity according to needs. Regulated metal photoprobes. Background technique [0002] Generating nanofocused strong fields with large longitudinally polarized electric field components is crucial for improving single-molecule imaging, heat-assisted magnetic recording, nanolithography, and induced thermal electrons. At present, there are a variety of metal structures that enhance nano-focusing, the most commonly used is the metal nano-linear tapered structure, but the focusing of linear nano-structures has limitations, and the light field cannot be focused by changing the radius of curvature, and it does not have nonline...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01Q70/10G01N21/65B82Y30/00B82Y40/00B82Y15/00
CPCB82Y15/00B82Y30/00B82Y40/00G01N21/658G01Q70/10
Inventor 匡登峰滕学智姚广宇陈思宇
Owner NANKAI UNIV
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