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Method and apparatus for imaging an object

An object and imaging technology, which is applied in the direction of instruments, microscopes, optics, etc., can solve the problems of image quality reduction and image quality impact, and achieve the effect of less error-prone, cost-effective, and simple implementation

Active Publication Date: 2019-07-05
CARL ZEISS MICROSCOPY GMBH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] In general, imperfections of illumination devices, such as limited coherence of light, heterogeneous illumination, only limited choice of illumination direction, other distortions of the illumination field, etc., can be avoided when applying Fourier stack imaging techniques. Has a negative impact on the quality of the resulting image
However, it may often be difficult to accept such limitations on the quality of the lighting device in order to obtain a lighting device that is actually achievable
So again it may not be possible or only to a limited extent to be able to use conventional Fourier stack imaging techniques for image evaluation purposes
Specifically, degradation of the resulting image quality may occur

Method used

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  • Method and apparatus for imaging an object
  • Method and apparatus for imaging an object
  • Method and apparatus for imaging an object

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Embodiment Construction

[0037] Hereinafter, the present invention is explained in more detail based on preferred embodiments with reference to the accompanying drawings. In the drawings, the same reference numerals designate the same or similar elements. The drawings are schematic representations of various embodiments of the invention. Elements depicted in the figures are not necessarily drawn to true scale. Rather, the various elements depicted in the figures are reproduced in such a manner that one skilled in the art can understand their function and general use. The connections and couplings between functional units and elements depicted in the figures may also be realized as indirect connections or couplings. Connection or coupling can be accomplished in a wired or wireless manner. The functional units can be realized as hardware, software or a combination of hardware and software.

[0038] Techniques to facilitate determination of high resolution result images based on images with low resol...

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Abstract

At least two images (201-1-201-3) of an object (100) are obtained, wherein each image has an illumination field (110-1-110-3) associated therewith, which is associated with predetermined beam shape properties (111-1-111-3). For each one of the at least two images (201-1-201-3) an effect of the beam shape properties is added to a predetermined approximation of the object, the approximation is adjusted by means of Fourier ptychography techniques on the basis of the respective image and then the effect of the beam shape properties is removed from the adapted approximation of the object.

Description

technical field [0001] Various aspects relate to a method for imaging an object using a microscope arrangement and a corresponding microscope arrangement. In particular, various aspects relate to techniques for considering beam shape properties of an illumination field when determining a resulting image. Background technique [0002] In the microscopic examination of objects, the highest possible resolution or a high spatial bandwidth product and / or a high contrast is desired for many applications. Techniques are known which allow obtaining a relatively higher resolution resulting image by combining multiple images with relatively lower resolution in spatial frequency space (k-space). Fourier stack imaging is such a technique: see the article by G. Zheng et al. on Nature Photonics (7(2013) 739-745). In this method, the object to be examined by the microscope is illuminated successively in different illumination directions in a partially coherent manner. For each illuminat...

Claims

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Application Information

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IPC IPC(8): G02B21/06G02B21/36G02B27/58
CPCG02B21/06G02B21/367G02B27/58
Inventor 拉尔斯·施托佩克里斯托夫·胡泽曼
Owner CARL ZEISS MICROSCOPY GMBH
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