A testing system and method for quickly recovering a testing program
A test program and test system technology, applied in the electronic field, can solve the problems of occupying test engineers, inability to work, system crash of test platform, etc., and achieve the effect of shortening test time, reducing configuration time, and improving work efficiency
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0030] The present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments.
[0031] A kind of test system of fast recovery test program of the present invention comprises:
[0032] Generate a module to create a virtual system and configure it, and start the test program after the configuration is completed;
[0033] The running state judgment module is used to monitor the running state of the test program after the test program is started. When the running state is normal, the test program starts the test task; when the running state of the test program is abnormal, a restart command is sent;
[0034] A restart module, configured to restart the system when receiving the restart command sent by the running state judging module;
[0035] The initialization module is used to automatically restart the test program after restarting the system and initialize the test parameters of the test program.
[0036] The generation ...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com