Mutual information-based data discretization and feature selection integrated method and apparatus
A feature selection and integrated device technology, applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., can solve the problems of reducing the performance of learning algorithms, information loss, ignoring internal connections, etc., to avoid information loss and reduce information loss , improve the effect of learning
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[0054] The principles and properties of the present invention are described below in conjunction with the accompanying drawings, and the examples given are only used to explain the present invention and are not intended to limit the scope of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0055] The present invention provides a kind of data discretization and feature selection integration method, comprise three processes: the generation process of candidate breakpoint set, the forward search process of optimal breakpoint subset, data discretization and feature selection process, following steps:
[0056] The generation process of the set of candidate breakpoints, such as figure 1 As shown, the detailed process is as follows:
[0057] 1) As shown in step S101, for the eigenvalue distribution...
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