Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Galvanometer scanning system and scanning method for dual optical path imaging

A technology of galvanometer scanning and dual optical paths, which is applied in the laser field, can solve the problems of high inertia of the scanning system, low detection efficiency, and slow scanning response speed, etc., and achieve the effect of improving detection accuracy, improving detection efficiency, and meeting high precision

Active Publication Date: 2017-02-15
HANS LASER TECH IND GRP CO LTD +1
View PDF9 Cites 14 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The working principle of the two-dimensional laser galvanometer scanning system is: the galvanometer scanning system is different from the general mechanical scanning system. The general mechanical scanning system uses the transmission of the screw to drive the scanning head to move back and forth on the two-dimensional plane to complete the scanning. , because it is mechanical, the inertia of the scanning system is large, and the scanning response speed is relatively slow
The existing laser equipment with visual detection function on the market will have a smaller detection field of view under the condition of meeting the product detection accuracy, which is determined by the resolution of the camera itself. For a camera with the same resolution, the field of view will be smaller. The smaller the value, the higher the accuracy of visual detection, but this will bring another problem, and the detection efficiency will be greatly reduced
The highest resolution camera currently on the market can only reach 10 million pixels, and it is difficult to find a lens with such a high resolution that can match it in the market now. Even if you can find it, the price of the camera and lens is very expensive It is difficult to meet the requirements of high quality, high efficiency and low cost in the current market

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Galvanometer scanning system and scanning method for dual optical path imaging
  • Galvanometer scanning system and scanning method for dual optical path imaging
  • Galvanometer scanning system and scanning method for dual optical path imaging

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0045]In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the associated drawings. Preferred embodiments of the invention are shown in the accompanying drawings. However, the present invention can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, these embodiments are provided to make the understanding of the disclosure of the present invention more thorough and comprehensive.

[0046] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field of the invention. The terms used herein in the description of the present invention are for the purpose of describing specific embodiments only, and are not intended to limit the present invention.

[0047] refer to figure 1 As shown, the present invention provides a dual optical pat...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to the field of laser technology, and discloses a galvanometer scanning system for dual optical path imaging. The galvanometer scanning system comprises a first lens, a second lens, a large field of view imaging unit, a small field of view imaging unit, a focusing mirror, an XY scanning galvanometer, and an optical source. An external laser optical path reaches the XY scanning galvanometer through the first lens, and after reflection, acts on an object to be marked to conduct marking sequentially through the focusing mirror and the second lens. The optical source is lit up to send out a lighting optical path to illuminate the object to be marked, the lighting optical path is reflected onto the second lens, a part of the lighting optical path is reflected through the second lens into the large field of view imaging unit to image for monitoring the marking condition. The other part of the lighting optical path is focused through the second lens and the focusing mirror onto the XY scanning galvanometer, and reflected through the first lens into the small field of view imaging unit to image for detecting the marking condition. The invention can improve the detection accuracy and detection efficiency of the scanning system.

Description

technical field [0001] The present invention relates to the field of laser technology, and more specifically, to a dual optical path imaging galvanometer scanning system and scanning method. Background technique [0002] In this era of rapid technological development, technological innovation has become a symbol of the current era, and the development of laser technology is even more unique. Many achievements of laser technology innovation are changing people's lives from all aspects, and it can be predicted that the 21st century will be an era of laser technology shining brightly. As an important role of laser technology, laser scanning technology will be widely used in laser processing, image transmission, medical CT equipment and so on. Among various laser scanning systems, the two-dimensional laser galvanometer scanning system has been most widely used due to its high speed and high efficiency. The working principle of the two-dimensional laser galvanometer scanning sy...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G02B26/10G01B11/00G01N21/956
Inventor 闫静李玉廷王光能舒远丁兵高云峰
Owner HANS LASER TECH IND GRP CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products