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Cover defect detection method based on image processing

A defect detection and image processing technology, applied in image data processing, image analysis, image enhancement, etc., can solve problems such as high requirements for illumination consistency, prone to misjudgment and missed judgment, and prone to misdetection, and achieves a high level of improvement. The effect of detection accuracy, less detection time and high detection efficiency

Inactive Publication Date: 2016-12-21
WUHAN UNIV
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Problems solved by technology

When the edge is disturbed by noise, the method is prone to misjudgment and missed judgment
He Jinbiao and others [1] On the basis of edge detection, it is determined whether there is a defect in the inner circle by analyzing the difference in the mean variance of the inner gray value of the inner circle of the can lid to be detected and the standard can lid. High requirements, when the light changes, it is prone to false detection

Method used

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  • Cover defect detection method based on image processing
  • Cover defect detection method based on image processing
  • Cover defect detection method based on image processing

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Experimental program
Comparison scheme
Effect test

Embodiment

[0142] Will verify effectiveness of the present invention below by embodiment.

[0143] Select a group of can lid images of the same model (model 209) containing different types of defects for defect detection processing, a total of 45 images to be detected, which contain different numbers of normal images, edge defect images, glue injection defect images, all images Both are 750×700 bmp format images. The hardware environment is Intel Core I3-2350CPU, 2.30G Hz main frequency, 4G memory, the software environment is Microsoft Windows 7 (64-bit operating system), and the VisualStudio2013 platform is used to realize the automatic detection process through C++ programming, and finally output the detection results and detection time . See Table 1 for the experimental data.

[0144] Table 1 Experimental data statistics

[0145]

[0146] It can be seen from Table 1 that the correct defect detection rate of the method of the present invention reaches 95.6%, and the detection effic...

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Abstract

The invention discloses a cover defect detection method based on image processing. The method comprises steps that S1, an excircle contour radius and glue injection zone width of a standard image are acquired in a man-machine interaction mode; S2, edge detection on a to-be-detected cover image is carried out to determine an edge image; S3, edge tracking of the edge image is carried out to acquire edge points, edge fitting of the edge points is carried out to acquire a fitting circle center position and a fitting radius; in combination with the glue injection zone width of the standard image, the fitting circle center position and the fitting radius, the glue injection zone is determined; and S4, cover defect detection and identification are carried out. Through the method, properties of short time, high efficiency and good timely detection effect are realized, and the excellent detection effect is acquired in an actual production line.

Description

technical field [0001] The invention belongs to the technical field of industrial product quality inspection, and in particular relates to an image processing-based defect inspection method for can lids. Background technique [0002] In recent years, people have higher and higher requirements for the safety, health and diversification of food and article packaging. The production and testing of metal can lids made of tinplate are facing higher requirements and challenges. The quality of the can lid directly affects the packaging of the product packaging can, and plays a key role in the quality and safety of the product. [0003] During the entire production process of can lids, due to defects in raw materials, equipment aging, improper operation of employees and other factors, can lids will have various defects. Among them, the common defects mainly include edge deformation, excess glue, glue leakage, overlapping, etc. defective condition. Under the action of these defects...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00
CPCG06T7/0004G06T2207/30128
Inventor 梅天灿贺赛先耿学贤蒋稳
Owner WUHAN UNIV
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