Quick test technology of EEPROM (Electrically Erasable Programmable Read-Only Memory)

A memory and fast technology, applied in the field of testing, can solve the problems of long testing time, time-consuming, and multiple testing resources, and achieve the effect of high testing efficiency.

Active Publication Date: 2016-12-07
深圳市航顺芯片技术研发有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Writing data to the EEPROM memory can only be completed by erasing and programming the entire page at the fastest, which requires a lot of writing test time
In addition, due to the limitation of the number of IO PADs in general products, the test data is generally transmitted in a serial manner, and the test time is also very long.
The significant disadvantages of this testing method are therefore:
[0004] 1. Writing data to the EEPROM memory can only be written page by page, which takes too much time
[0005] 2. Most of the reading and writing data ...

Method used

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  • Quick test technology of EEPROM (Electrically Erasable Programmable Read-Only Memory)
  • Quick test technology of EEPROM (Electrically Erasable Programmable Read-Only Memory)

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Embodiment Construction

[0043] Combine below figure 1 Implementation of the present invention will be described.

[0044] figure 1 It mainly shows the realization of the test module of EEPROM memory from the hardware. The whole test is mainly completed by the test control module. The test control device mainly includes: a control logic unit, a high voltage control unit, a data reading unit, a data comparison unit and a test result output unit. These logic functions are actually relatively simple and require less logic resources.

[0045] figure 2 The test process of the entire EEPROM memory is mainly described from the test flow. First, after the test control device receives the test command, the erasing module immediately erases the EEPROM as a whole. After erasing, all the data in the memory should be 0xFF. After the erasing is completed, the data reading module will immediately read the data of the storage unit in the EEPROM memory. The zero data comparison module will judge whether the dat...

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Abstract

The invention discloses a quick test technology of an EEPROM (Electrically Erasable Programmable Read-Only Memory). The quick test technology is characterized in comprising a test control module, a high-voltage control module, a data reading module, a data comparison module, a logic control module, a data judgment module and a memory cell in the EEPROM. The data writing and reading of the EEPROM is completely controlled by internal logic to be finished, in addition, a data comparison process and a test judgment process are controlled by the internal logic to be realized, and finally, only a test result signal needs to be sent out. Test efficiency is very high. In a test process, written data does not adopt checkerboard test data (0x55 and 0xAA) but adopts 0x00and 0xFF test data which can be easily erased and written by the EEPROM to finish a test, and therefore, the test efficiency can be greatly improved. The whole test process of the test method hardly depends on external test resources.

Description

technical field [0001] The invention relates to the field of testing, in particular to a fast testing technology for EEPROM memory. Background technique [0002] The current electronic erasable rewritable read-only memory circuit or IP test usually adopts a checkerboard test method, that is, for the EEPROM memory circuit or IP to be tested, first write 0x55 data to all bytes, and then write the EEPROM memory The data in is read out and compared. Then also write 0xAA data to all bytes of the EEPROM memory, and then read and compare the data of the EEPROM memory. [0003] Writing data to the EEPROM memory can only be completed by erasing and programming the entire page at the fastest, which requires a lot of writing test time. In addition, limited by the number of IO PADs in general products, the test data is generally transmitted in a serial manner, and the test time is also very long. The significant disadvantages of this method of testing are therefore: [0004] 1. Writ...

Claims

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Application Information

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IPC IPC(8): G11C29/18G11C29/44
CPCG11C29/18G11C29/44
Inventor 刘吉平唐伟张怀东
Owner 深圳市航顺芯片技术研发有限公司
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