Full-automatic single-grain testing device for rectifier bridge

A test device, rectifier bridge technology, applied in the direction of measurement device, measurement of electricity, measurement of electric variables, etc., can solve the problems of increasing the risk of electric shock and low efficiency, and achieve the effect of reducing the risk of testing, avoiding the risk of electric shock, and protecting safety.

Active Publication Date: 2016-10-26
YANGZHOU HY TECH DEV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

During the test process, manual contact is required, which increases the risk of electric shock (the test voltage of the testing machine is generally several hundred volts to several thousand volts, which is much higher than the human body safety voltage of 36V), and the efficiency of completing the entire test is low

Method used

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  • Full-automatic single-grain testing device for rectifier bridge
  • Full-automatic single-grain testing device for rectifier bridge
  • Full-automatic single-grain testing device for rectifier bridge

Examples

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Embodiment Construction

[0023] Embodiments of the technical solutions of the present invention will be described in detail below in conjunction with the accompanying drawings. The following examples are only used to illustrate the technical solution of the present invention more clearly, so they are only examples, and should not be used to limit the protection scope of the present invention.

[0024] It should be noted that, unless otherwise specified, the technical terms or scientific terms used in this application shall have the usual meanings understood by those skilled in the art to which the present invention belongs.

[0025] like figure 1 As shown, the traditional test method for a failed rectifier bridge is as follows: To test the D1 grain: clamp the positive test wire of the tester 1 to the "D" terminal of the rectifier bridge 2, and clamp the negative pole of the tester 1 to the "C" terminal of the rectifier bridge 2. " terminal; test D2 crystal grain: clamp the positive test wire of teste...

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Abstract

The invention provides a full-automatic single-grain testing device for a rectifier bridge. The device provided by the invention comprises a circuit switching module, a processor, a testing machine interface, and a testing socket. The testing machine interface is connected with the circuit switching module, and the circuit switching module is connected with the testing socket. The processor is connected with the circuit switching module. The testing machine interface is used for connecting a testing line of a testing machine, and the testing socket is used for connecting the rectifier bridge. The circuit switching module is used for switching the states of connection between the testing machine interface and the testing socket. The processor is used for controlling the circuit switching module to carry out the switching of the connection states. The device provided by the invention replaces a conventional mode of manual repeated clamping for testing, improves the testing efficiency of an invalid rectifier bridge, and reduces the testing risks.

Description

technical field [0001] The invention relates to a full-automatic single grain testing device for a rectifier bridge. Background technique [0002] Existing testing machines can only manually clamp and test the failed rectifier bridge one by one. A total of 4 dies are integrated inside the bridge rectifier. If you want to test the data of each die, you need to manually perform 4 commutation pinch tests. Due to the need for manual contact during the test, the risk of electric shock is increased (the test voltage of the testing machine is generally several hundred volts to several thousand volts, which is much higher than the human body safety voltage of 36V), and the efficiency of completing the entire test is low. Contents of the invention [0003] Aiming at the defects in the prior art, the rectifier bridge full-automatic single-grain test device provided by the present invention replaces the traditional manual repeated pinch test operation through a full-automatic convers...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 张清
Owner YANGZHOU HY TECH DEV
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