Structural deformation monitoring method based on contour line image stacking difference analysis
A technology of structural deformation and contour line, applied in the direction of measuring devices, instruments, optical devices, etc., can solve the problem of not being able to economically and conveniently obtain holographic data of the geometric shape changes of the whole and component parts of large-scale civil engineering buildings, and the inability to use civil engineering buildings The monitoring of geometric changes of the overall structure and components, the loss of long-term safety evaluation of the overall structure of large-scale civil engineering buildings and the composition of the structure, etc., achieve the effect of low requirements, simple and convenient process, and convenient operation
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[0029] figure 1 It is a program block diagram of the present invention, figure 2 It is the beam stack image map (test map); image 3 for figure 2 Partial enlarged view of Figure 4 It is a contour line Xingcheng map, as shown in the figure: the structural deformation monitoring method based on the contour line image overlap analysis of the present embodiment includes the following steps:
[0030] a. Obtain a photo of the structure, and use the photos to stitch together a complete photo of the structure or a complete photo of the part of interest of the structure, and use the complete photo to obtain the outline of the structure or the part of concern of the structure Image, the part of the structure concerned refers to the part that needs to be monitored during the monitoring of the structure; the 3D digital model of the structure obtained through the combination and reconstruction of photos can be realized through existing software, and the 3D digital model of the struct...
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