Gate-level circuit simulation based key node extraction method

Abstract

The present invention discloses a gate-level circuit simulation based key node extraction method. The method mainly solves the problems of low searching efficiency, inaccurate node state range restoration and an excessively high duplication rate in the prior art. The method comprises: acquiring a connection relationship of a gate-level circuit; by simulating the gate-level circuit, generating a state of a corresponding gate-level node, and calculating a ratio of states of key nodes 0 and 1; extracting a frequent subcircuit of the gate-level circuit; restoring, by D flip-flop DFF nodes extracted from the frequent subcircuit, a node of the gate-level circuit; in combination with the number of the node restored by the D flip-flop DFF nodes and the ratio of the states of 0 and 1, calculation weighted values, and extracting the D flip-flop DFF node with the greatest weighted value; and on the basis of the extracted D flip-flop DFF nodes, sequentially extracting subsequent key nodes. By use of the method disclosed by the present invention, the duplication rate of the the restored node is decreased, the searching efficiency is increased, the state range of the node stored by the key nodes is expanded, and the method can be used for error detection of the gate-level circuit, and tracking of internal signals is realized.

Description

technical field [0001] The invention belongs to the technical field of circuit processing, and in particular relates to a method for extracting key nodes of a gate-level circuit, which can be used to detect errors existing in the gate-level circuit and realize tracking of internal signals. Background technique [0002] With the continuous improvement of chip scale and complexity, it takes too long to verify the correctness of the chip only by pre-silicon verification technologies such as simulation or formal verification, and it cannot fully guarantee the correctness of the first tape-out. In order to eliminate errors that cannot be found in the pre-silicon verification stage before the chip is released to the market, silicon debugging after the first tape-out is very necessary. [0003] Silicon debugging technology is divided into two technologies based on the scan chain and based on the trace signal. The scan chain-based silicon debugging technology mainly captures the st...

AI Technical Summary

Problems solved by technology

[0008] Since the extraction of traditional key nodes takes a single DFF node as the analysis object, by analyzing each node and its adjacent circuits, on the one hand, the search space is large, and there may even be some redundant searches, which leads to the algorithm The complexity is too high and the search efficiency is low; on the other hand, it does not consider the situation that multiple D flip-flop DFF nodes jointly restore the node state, resulting in inaccurate range of restored node state or high repetition rate

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