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Millimeter wave radiation brightness temperature acquisition method based on quick ray tracing

An acquisition method and ray tracing technology, which are applied in the field of millimeter wave radiation brightness temperature calculation in complex scenes, and can solve problems such as the inability of geometric models to complete ray tracing of complex targets and the influence of simulation results on authenticity.

Inactive Publication Date: 2016-09-21
HUAZHONG UNIV OF SCI & TECH
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AI Technical Summary

Problems solved by technology

In the above existing technologies, for the ray tracing of complex scenes, it is difficult for CSG to establish the geometric model of complex targets and cannot complete the ray tracing of complex targets, and the Blender rendering method cannot truly simulate the multiple emission process of radiation signals in complex scenes , which will inevitably affect the authenticity of the simulation results

Method used

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  • Millimeter wave radiation brightness temperature acquisition method based on quick ray tracing
  • Millimeter wave radiation brightness temperature acquisition method based on quick ray tracing
  • Millimeter wave radiation brightness temperature acquisition method based on quick ray tracing

Examples

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Embodiment

[0040] Embodiment: realize the simulation of the millimeter wave radiation image of the target scene of the ship on the calm sea surface.

[0041] A schematic flow chart of the method for calculating the brightness temperature of millimeter-wave radiation based on fast ray tracing in an embodiment of the present invention, as shown in figure 1 As shown, the method for calculating the brightness temperature of millimeter-wave radiation based on fast ray tracing in the embodiment of the present invention mainly includes the following steps:

[0042] Step 1, establish the geometric model of the complex three-dimensional structure target, and establish the micro-facet model of the three-dimensional target by meshing, such as Figure 7 shown;

[0043] Preferably, in order to enable the micro-surface element model to accurately express the structural characteristics of the target, the surface element subdivision should be fine enough. In this example, the number of micro-surface el...

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Abstract

The invention discloses a millimeter wave radiation brightness temperature acquisition method based on quick ray tracing. The millimeter wave radiation brightness temperature acquisition method based on quick ray tracing comprises the steps: S1 acquiring a stereo target surface microfacet in a scene to be detected; S2 according to the field range and the scanning angle set by the scene to be detected, establishing an imaging plane, according to the coordinates of pixel points on the imaging plane and the position of an antenna which receives a scene radiation signal during the simulation process, obtaining the scanning ray r<scan>', and successively traversing each pixel point and obtaining the scanning ray in a plurality of observation directions; S3 according to the microfacet and the scanning ray, utilizing a ray tracing algorithm to obtain a radiation signal transmission path; and S4 according to the target millimeter wave emissivity and the radiation signal transmission path, obtaining the millimeter wave radiation brightness temperature at the antenna from different observation directions. The millimeter wave radiation brightness temperature acquisition method based on quick ray tracing can effectively and accurately acquire millimeter wave radiation brightness temperature distribution of the target scene, and can provide more useful information for researching the millimeter wave radiation characteristics of a complicated scene.

Description

technical field [0001] The invention belongs to the technical field of passive microwave remote sensing and detection, and more specifically relates to a method for calculating brightness temperature of millimeter-wave radiation in complex scenes based on fast ray tracing. Background technique [0002] The calculation of the brightness temperature of millimeter-wave radiation for complex scenes is a hot and difficult point in current research. For a relatively simple three-dimensional structure target, the three-dimensional geometric representation of the scene target can usually be performed by constructive solid geometry (CSG), and the geometric feature information such as the normal vector of the model surface can be directly obtained, which can conveniently analyze the millimeter wave radiation signal in the scene. Simulation calculation, the published literature includes "Image Simulation Method of Microwave Radiation Brightness Temperature of Ground Objects" in "Journa...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/00
CPCG01J5/00
Inventor 胡飞郎量贺锋程亚运戚博刘斯远何小琴
Owner HUAZHONG UNIV OF SCI & TECH
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