Millimeter wave radiation brightness temperature acquisition method based on quick ray tracing
An acquisition method and ray tracing technology, which are applied in the field of millimeter wave radiation brightness temperature calculation in complex scenes, and can solve problems such as the inability of geometric models to complete ray tracing of complex targets and the influence of simulation results on authenticity.
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[0040] Embodiment: realize the simulation of the millimeter wave radiation image of the target scene of the ship on the calm sea surface.
[0041] A schematic flow chart of the method for calculating the brightness temperature of millimeter-wave radiation based on fast ray tracing in an embodiment of the present invention, as shown in figure 1 As shown, the method for calculating the brightness temperature of millimeter-wave radiation based on fast ray tracing in the embodiment of the present invention mainly includes the following steps:
[0042] Step 1, establish the geometric model of the complex three-dimensional structure target, and establish the micro-facet model of the three-dimensional target by meshing, such as Figure 7 shown;
[0043] Preferably, in order to enable the micro-surface element model to accurately express the structural characteristics of the target, the surface element subdivision should be fine enough. In this example, the number of micro-surface el...
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