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Chip testing method and device

A technology of chip testing and testing equipment, which is applied in the direction of measuring equipment, electronic circuit testing, measuring electricity, etc., and can solve problems such as poor compatibility of chip testing equipment

Active Publication Date: 2020-08-11
ANALOGIX SEMICON (SUZHOU) INC +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0008] Embodiments of the present invention provide a chip testing method and device to at least solve the technical problem of poor compatibility of chip testing devices in the prior art

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Embodiment Construction

[0028] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0029] It should be noted that the terms "first" and "second" in the description and claims of the present invention and the above drawings are used to distinguish similar objects, but not necessarily used to describe a specific sequence or sequence. It is to be understood that the data so used are interchangeable under appropriate ...

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Abstract

The invention discloses a chip test method and a chip test device. The chip test device comprises the test equipment, a chip test circuit board, an input interface which is arranged on the chip test circuit board, is connected with the test equipment and is used for carrying out data transmission between the test equipment and the chip test circuit board, and a controller which is arranged on the chip test circuit board, is connected with a to-be-tested chip and the input interface, is used for acquiring a state instruction of the input interface and determining a corresponding test vector according to the state instruction, wherein the controller is further used for sending a work mode corresponding to the test vector to the to-be-tested chip to make the to-be-tested chip operate in a work mode, the controller is further used for acquiring a work state of the to-be-tested chip operating in the work mode and determining a detection result of the to-be-tested chip according to the work state. Through the method and the device, a technical problem of poor compatibility existing in a chip test device in the prior art is solved.

Description

technical field [0001] The invention relates to the field of chip testing, in particular to a chip testing method and device. Background technique [0002] see figure 1 , the chip testing device in the prior art basically completes the testing of the chip through the control of the computer, and the above-mentioned chip testing device is composed of three parts, which are respectively a computer, a testing device and a chip testing circuit board. The specific test process is: according to the function of the chip to be tested, the required test vector is compiled in the computer, the converted program drives the signal pin of the test equipment to output the required signal, and then the chip test circuit board runs. The test method corresponding to the above-mentioned chip test device has the following disadvantages: [0003] 1. Debugging is difficult. The actual application environment of the chip is very different from the test environment of the chip, which leads to a...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28G05B19/042
CPCG01R31/2851G05B19/0423G05B2219/24036
Inventor 郭春成郑又诚彭嘉庆
Owner ANALOGIX SEMICON (SUZHOU) INC
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