Transformer station intelligent electronic device multi-source anti-interference degree characteristic testing method
A technology of an intelligent electronic device and a testing method, which is applied in the direction of measuring devices, measuring electricity, and measuring electrical variables, etc., can solve problems such as failure to reflect the influence of electromagnetic environment interaction, problems, etc., to improve credibility and authority, and save energy. The effect of test time
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[0037] The specific embodiments of the present invention will be further described in detail below in conjunction with the accompanying drawings.
[0038] The invention provides a testing method, which includes a method of combining the intelligent electronic device with surge testing, electrical fast transient burst testing, voltage sag testing and electrostatic testing under power frequency magnetic field immunity testing.
[0039] The power frequency magnetic field test is aimed at the external magnetic field, and the power supply of the intelligent electronic device adopts an intelligent power supply. The intelligent power supply includes a surge generator, an electrical fast transient burst generator, and a voltage sag generator. During testing, the intelligent power supply can be adjusted to one of the three for testing.
[0040] The generator can not only provide the voltage required for the normal operation of the intelligent electronic device, but also provide the cor...
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